2020 International Conference on Power Electronics &Amp; IoT Applications in Renewable Energy and Its Control (PARC) 2020
DOI: 10.1109/parc49193.2020.236620
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A Comparative Performance Analysis of 6T, 7T and 8T SRAM Cells in 18nm FinFET Technology

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Cited by 5 publications
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“…40,41 Additionally, few simulations factors were recorded for the proposed 21T-Cell since most of the simulations had been exploited for the SRAM-based 8T-Cell in previous works. [34][35][36] Subsequently, the DC simulation measures the sensitivity operations in terms of noise margin using the butterfly input(v) versus output(v) as delineated in Table 2. Such as the characteristics of noise margin pertains to read (RNM), write (WNM), and content-address (CNM).…”
Section: Hspice Simulationsmentioning
confidence: 99%
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“…40,41 Additionally, few simulations factors were recorded for the proposed 21T-Cell since most of the simulations had been exploited for the SRAM-based 8T-Cell in previous works. [34][35][36] Subsequently, the DC simulation measures the sensitivity operations in terms of noise margin using the butterfly input(v) versus output(v) as delineated in Table 2. Such as the characteristics of noise margin pertains to read (RNM), write (WNM), and content-address (CNM).…”
Section: Hspice Simulationsmentioning
confidence: 99%
“…Consequently, the write operation also has a superior noise margin with respect to 6T-Cell since the cross-coupled inverters are dedicated for only write operation, and thus their geometry sizes are designed for maximum butterfly shape. [34][35][36] Furthermore, the sizes of the transistors of the proposed 21T-Cell have two different values. The size of the transistors of the write circuitry is W = 180 nm/L = 180 nm, while the size of the transistors of the read and content-address circuits is W = 180 nm/L = 90 nm.…”
Section: Hspice Simulationsmentioning
confidence: 99%
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