2009
DOI: 10.1016/j.tsf.2009.07.143
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A comparative micro-cantilever study of the mechanical behavior of silicon based passivation films

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Cited by 221 publications
(92 citation statements)
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“…Another approach is to create a micro-scale specimen, typically using techniques such as focus ion beam milling [10] [18], micro-electron-discharge machining and laser ablation, and then deform the specimens by a non-sharp tip nano-indenter such as a conical or flat punch that has a large diameter compared with the local microstructure, or a purpose-built loading probe [19]. The tests can be undertaken either ex situ under an optical microscope [11] or in situ within a scanning electron microscope [10] and/or an atomic force microscope [12]. A range of test geometries have been adopted including pillar compression, single cantilever bending, clamped cantilever bending, double cantilever bending and uniaxial tension [19][18] [10].…”
Section: A C C E P T E D Accepted Manuscriptmentioning
confidence: 99%
See 1 more Smart Citation
“…Another approach is to create a micro-scale specimen, typically using techniques such as focus ion beam milling [10] [18], micro-electron-discharge machining and laser ablation, and then deform the specimens by a non-sharp tip nano-indenter such as a conical or flat punch that has a large diameter compared with the local microstructure, or a purpose-built loading probe [19]. The tests can be undertaken either ex situ under an optical microscope [11] or in situ within a scanning electron microscope [10] and/or an atomic force microscope [12]. A range of test geometries have been adopted including pillar compression, single cantilever bending, clamped cantilever bending, double cantilever bending and uniaxial tension [19][18] [10].…”
Section: A C C E P T E D Accepted Manuscriptmentioning
confidence: 99%
“…In these cases, the specimen manufacture process is more complicated than that adopted for conventional nano-indentation, but it is possible to obtain a measure of elastic modulus, yield, tensile and flexural strength, fracture toughness and fracture energy, e.g. by introducing a Chevron notch using low-current focus ion beam line milling [12].…”
Section: A C C E P T E D Accepted Manuscriptmentioning
confidence: 99%
“…Nanoindentation induced deformation of microscale structures fabricated using focused ion beam (FIB) milling has been increasingly utilised for investigating the properties of thin films [15,16]. The deformation of a well-defined structure milled into a microscale feature of interest, allows the feature to be studied under a simple, quantifiable stress-state.…”
Section: Introductionmentioning
confidence: 99%
“…Even at the micron and submicron length scale, various studies [1][2][3][4][5][6][7][8] have shown that versatile fracture experiments can be adequately evaluated. Rectangular beams with and without notches were prepared in diamond-like carbon coatings by Schaufler et al 2 to investigate the fracture toughness and the interface strength of their films with a thickness below 1 lm.…”
Section: Introductionmentioning
confidence: 99%
“…Rectangular beams with and without notches were prepared in diamond-like carbon coatings by Schaufler et al 2 to investigate the fracture toughness and the interface strength of their films with a thickness below 1 lm. Matoy et al 3 used a similar geometry and investigated among other things the fracture toughness of passivated silicon based thin films. Various geometries such as cantilevers, double-cantilevers, clamped beams, and pillars were applied by Jaya et al 5 in silicon to compare the fracture toughness obtained by different geometries and evaluation methods.…”
Section: Introductionmentioning
confidence: 99%