2019
DOI: 10.1109/jlt.2019.2913179
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A Compact Model for Si-Ge Avalanche Photodiodes Over a Wide Range of Multiplication Gain

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Cited by 22 publications
(24 citation statements)
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“…where k A is the ionization-coefficient ratio. For Si-Ge based APDs, k A is in the range of 0.04-0.2 [3,28] and is relatively lower than for III-V devices (0.4 − 0.5). [29] Another noise term that is amplified by the APD gain is the laser's relative intensity noise (RIN) that describes how the light power fluctuates with time.…”
Section: Apd Noisementioning
confidence: 89%
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“…where k A is the ionization-coefficient ratio. For Si-Ge based APDs, k A is in the range of 0.04-0.2 [3,28] and is relatively lower than for III-V devices (0.4 − 0.5). [29] Another noise term that is amplified by the APD gain is the laser's relative intensity noise (RIN) that describes how the light power fluctuates with time.…”
Section: Apd Noisementioning
confidence: 89%
“…[19] Avalanche photodiodes have a multiplication region and exhibit higher gain and hence higher effective responsivity due to the avalanche effect. [24] A schematic and crosssection micrograph of an APD structure [25] is shown in Figure 2. Figure 1 illustrates a conceptual DWDM link based on MRR devices and APDs that can be utilized for 400 Gb s −1 Ethernet systems.…”
Section: System Architecturementioning
confidence: 99%
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