A compact low-cost test equipment for thermal and electrical characterization of integrated circuits

Cabrini, A.; Gobbi, Laura; Baderna, D.; Torelli, G.

doi:10.1016/j.measurement.2008.06.011

Cited by 8 publications

(5 citation statements)

References 12 publications

(15 reference statements)

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“…In the last few years, one of the most important challenges in production testing of VLSI circuits is application and measurement of high frequency signals using an ATE [8]. Although high speed ATEs are being developed, their applicability is limited because of the extremely high financial cost.…”

Section: Literature Survey On Early Test Development For Ams Circuitsmentioning

confidence: 99%

FPGA based chip emulation system for test development of analog and mixed signal circuits: A case study of DC–DC buck converter

2012

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Section: Literature Survey On Early Test Development For Ams Circuitsmentioning

confidence: 99%

FPGA based chip emulation system for test development of analog and mixed signal circuits: A case study of DC–DC buck converter

2012

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“…Also, channel estimation for MIMO uses FPGAs for efficient hardware resource utilization [149] and fast prototyping algorithms [150,151]. The USB (Universal Serial Bus) interface has been widely used for FPGAs' boards to a host computer communications [152][153][154][155][156]. In the same way, some authors have built FPGA security systems for monitoring and detecting USB cable attacks [157] and also for building cryptography systems to add security to USB devices [158].…”

Section: Serialmentioning

confidence: 99%

Field Programmable Gate Array Applications—A Scientometric Review

2019

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Field Programmable Gate Array (FPGA) is a general purpose programmable logic device that can be configured by a customer after manufacturing to perform from a simple logic gate operations to complex systems on chip or even artificial intelligence systems. Scientific publications related to FPGA started in 1992 and, up to now, we found more than 70,000 documents in the two leading scientific databases (Scopus and Clarivative Web of Science). These publications show the vast range of applications based on FPGAs, from the new mechanism that enables the magnetic suspension system for the kilogram redefinition, to the Mars rovers’ navigation systems. This paper reviews the top FPGAs’ applications by a scientometric analysis in ScientoPy, covering publications related to FPGAs from 1992 to 2018. Here we found the top 150 applications that we divided into the following categories: digital control, communication interfaces, networking, computer security, cryptography techniques, machine learning, digital signal processing, image and video processing, big data, computer algorithms and other applications. Also, we present an evolution and trend analysis of the related applications.

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“…Many measurement devices can be reprogrammed for the purpose of the researcher using different programming languages and common command systems such as Standard Commands for Programmable Instruments (SCPI). However, in order to do this, the researcher needs to know programming languages such as C+, XML and/or Phyton [2,[5][6][7]. However, some manufacturers also offer the main software packages to the users in order to allow more flexible use of their devices [8].…”

Section: Introductionmentioning

confidence: 99%

Programming the Measurement System by using VEE Pro to Determine Cyclic I-V Characteristics: Resistive Switching Device Application

Temel

Akkaya

2023

Erzincan Üniversitesi Fen Bilimleri Enstitüsü Dergisi

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In this study we introduce a simple program for cyclic current–voltage (I–V) measurements for bipolar and unipolar resistive switching devices. This program (Cyclic I-V, CYC-IV) was developed under the Keysight VEE Pro (Visual Engineering Environment Program) software and has a graphical interface. CYC-IV was developed for programming the Keysight B2912 Precision Source/Measure Unit (SMU) for I-V measurement of resistive switching devices in sweep mode. CYC-IV can be used in six different sweep mode. Moreover, the ramp rate, upper and lower limits of bias, cycle delay time and number of cycles easily define by user. Measurement results were visualized in three graphs that can be viewed simultaneously with the measurements.

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A compact low-cost test equipment for thermal and electrical characterization of integrated circuits

Cited by 8 publications

References 12 publications

FPGA based chip emulation system for test development of analog and mixed signal circuits: A case study of DC–DC buck converter

FPGA based chip emulation system for test development of analog and mixed signal circuits: A case study of DC–DC buck converter

Field Programmable Gate Array Applications—A Scientometric Review

Programming the Measurement System by using VEE Pro to Determine Cyclic I-V Characteristics: Resistive Switching Device Application

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