A compact error model for reliable system design

Israr, Adeel; Shoufan, Abdulhadi; Huss, Sorin A.

doi:10.1109/hpcsim.2009.5191574

Cited by 1 publication

(1 citation statement)

References 7 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The first one overcomes the second disadvantage only, whereas the second method results in just an approximate calculation of reliability values. In [10] and [11] we presented a scheme for system-level design considering reliability as the main design parameter. A data structure termed as system error decision diagram (SEDD), which models both permanent and transient errors, was presented, while considering nonfail silent resources.…”

Section: Introductionmentioning

confidence: 99%

Reliable system design using decision diagrams in presence of hard and soft errors

Israr

Huss

2014

Proceedings of 2014 11th International Bhurban Conference on Applied Sciences &Amp; Technology (IBCAST) Islamabad, Pakistan, 14

Self Cite

View full text Add to dashboard Cite

Hard and soft errors are inherently different in property and effect on the functionality of systems. Utilizing this fact, a new reliability model is developed, i.e., "lifetime reliability", which considers both hard and soft errors occurring in information processing systems.Based on an introduction of System Decision Diagrams a couple of new data structures denoted as System Resource Decision Diagram and System Task Instance Decision Diagram, respectively, are proposed. The first data structure deals with the hard errors occurring in the system, whereas the second one represents the effects soft errors have on the system's functionality. Together, these data structures help calculate the lifetime reliability of the system they are representing. Both the construction of this diagram pair and the memory-aware evaluation of the reliability based on it are detailed in an algorithmic way. The error model representation and the reliability quantification approach are aimed to be employed in a high-level design process to accelerate exploration of design space.The proposed method is illustrated for a number of benchmarks taken from published papers. The achieved results demonstrate that this novel approach is highly memory efficient and at the same time accurate as compared to previous known schemes. Index Terms-SystemDecision Diagrams, zero-suppressed decision diagram, hard error, soft error, system-level design, embedded system, reliability evaluation

show abstract

Section: Introductionmentioning

confidence: 99%