A CMOS Active Pixel Sensor With Light Intensity Filtering Characteristics for Image Thresholding Application

Huang, Chia-Chin; Huang, Jalin K.; Lee, Chi‐Wei; Lin, Chrong Jung

doi:10.1109/jsen.2011.2170163

Cited by 6 publications

(4 citation statements)

References 12 publications

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“…Silicon photodetectors can create photogenerated currents for impinging light with wavelengths across the complete visible range. The produced photocurrent is proportional to the intensity of the incident light [19][20][21] and is given by [21]:…”

Section: Quantum Effectsmentioning

confidence: 99%

A Review of Optical Sensors in CMOS

Gounella,

Ferreira,

Amorim

et al. 2024

Electronics

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This paper presents an overview of silicon-based optical sensors for the measurement of light in the visible spectrum range. The review is focused on sensors based on CMOS (complementary metal-oxide semiconductor) technology due to the high availability, low cost, ease of prototyping, and well-established fabrication processes. CMOS technology allows integration with the CMOS readout and control electronics in the same microdevice, featuring high-volume fabrication with high-reproducibility and low-cost. This review starts with an explanation of the phenomena behind opto-electronic transduction. It also presents and describes the most common components responsible for optical transduction, readout electronics, and their main characteristics. This review finishes with the presentation of selected applications to grasp where and how these sensors can be used.

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Section: Quantum Effectsmentioning

confidence: 99%

A Review of Optical Sensors in CMOS

Gounella,

Ferreira,

Amorim

et al. 2024

Electronics

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“…Each pixel structure has a photosensitive element, usually a photodiode that generates a charge in response to incident light. Charge-coupled devices (CCDs) and complementary metal oxide semiconductor (CMOS) devices are the two main commercial technologies that have traditionally been used as image sensors [ 37 , 38 , 39 , 40 ]. Currently available image sensors include a large number of pixels arranged in a matrix of rows and columns, which largely determines the resolution of the image sensor, along with other variables.…”

Section: Introductionmentioning

confidence: 99%

Application of Image Sensors to Detect and Locate Electrical Discharges: A Review

Ruiz

2022

Sensors

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Today, there are many attempts to introduce the Internet of Things (IoT) in high-voltage systems, where partial discharges are a focus of concern since they degrade the insulation. The idea is to detect such discharges at a very early stage so that corrective actions can be taken before major damage is produced. Electronic image sensors are traditionally based on charge-coupled devices (CCDs) and, next, on complementary metal oxide semiconductor (CMOS) devices. This paper performs a review and analysis of state-of-the-art image sensors for detecting, locating, and quantifying partial discharges in insulation systems and, in particular, corona discharges since it is an area with an important potential for expansion due to the important consequences of discharges and the complexity of their detection. The paper also discusses the recent progress, as well as the research needs and the challenges to be faced, in applying image sensors in this area. Although many of the cited research works focused on high-voltage applications, partial discharges can also occur in medium- and low-voltage applications. Thus, the potential applications that could potentially benefit from the introduction of image sensors to detect electrical discharges include power substations, buried power cables, overhead power lines, and automotive applications, among others.

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“…Edgedetection algorithm implementations on the focal-plane based on the spatial image gradient [7] [8] are more attractive from the perspective of interactive sensor applications, machine vision and power/area efficient sensor design. Although both [7] and [8] present scalable edge-detection hardware, their detection range is fixed and limited to very high spatial frequencies, which is not the case of DoG.…”

Section: Introductionmentioning

confidence: 99%

A retina-inspired robust on-focal-plane multi-band edge-detection scheme for CMOS image sensors

Katic

Schmid

Leblebici

2014

2014 IEEE 57th International Midwest Symposium on Circuits and Systems (MWSCAS)

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An edge-detection scheme suitable for machine vision and digital motion detection applications is presented. The scheme is inspired by the human visual system (human retina) and modified for a compact and scalable CMOS hardware implementation. In addition, pixel circuit and implementation of the scheme on a CMOS focal-plane are proposed and simulation results are presented. The circuit performs thresholding and single-bit quantization of high-frequency image content over multiple frequency bands using a low-complexity down-sampling scheme. As a result, a 1-bit per pixel output is obtained which results in efficient edge-detection of the image content. Depending on the number of the utilized frequency bands, the presented scheme achieves image compression levels that range from 1 BPP (bit-per-pixel) to 1.33 BPP. The proposed acquisition technique and the corresponding CMOS circuit can easily be adjusted to various imaging applications and scaled towards new CMOS technology nodes and high resolution image sensors.

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A CMOS Active Pixel Sensor With Light Intensity Filtering Characteristics for Image Thresholding Application

Cited by 6 publications

References 12 publications

A Review of Optical Sensors in CMOS

A Review of Optical Sensors in CMOS

Application of Image Sensors to Detect and Locate Electrical Discharges: A Review

A retina-inspired robust on-focal-plane multi-band edge-detection scheme for CMOS image sensors

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