A class-based clustering static compaction technique for combinational circuits

Efficient test compaction for combinational circuits based on Fault detection count-directed clustering

“…Recently, two static compaction techniques based on test vector decomposition and clustering have been proposed in [1][2][3]. The first technique, called Independent Fault Clustering (IFC) [1,2], is based on clustering test vectors according to independent fault sets.…”

“…The first technique, called Independent Fault Clustering (IFC) [1,2], is based on clustering test vectors according to independent fault sets. The second technique, called Class-based Clustering (CBC) [1,3], is based on classifying test vectors into classes and then eliminating test vectors by moving their components to other test vectors.…”

“…In the second category, compaction is performed by modifying test vectors. This is achieved by merging of compatible test vectors based on test relaxation or raising [12,[13][14][15], essential fault pruning [9,[15][16][17], or test vector decomposition and clustering [1][2][3]. Finally, the third category of static compaction algorithms consists of compaction algorithms that add new test vectors to a given test set in order to remove some of the already existing test vectors [10,18].…”