Abstract:This paper describes a transmitter that can emulate a wide variety of frequency-dependent loss characteristics of high-speed dynamic random-access memory (DRAM) channels, with an aim to facilitate an automated test procedure for a DRAM interface, which does not require physical reconfiguration of channels. Specifically, the proposed transmitter can generate the waveform of an NRZ data stream that has experienced adjustable amounts of skin-effect loss and dielectric loss in electrical channels. To save the hard… Show more
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