A century of spectral interferences in atomic emission spectroscopy — Can we master them with modern apparatus and approaches?

Boumans, P.W.J.M.

doi:10.1007/bf00474112

Cited by 55 publications

(7 citation statements)

References 82 publications

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“…Spectral interferences, especially line overlaps, can be a major problem in ICP-AES. [35][36][37] Although efforts have been made to collect spectral interference data in different matrices [38][39][40][41] or to build in databases in commercial ICP-AES instruments to help users select emission lines free from spectral interference in different matrices, 42 the selection of an appropriate analytical line can still be difficult, especially for a sample with a complex or unknown matrix. Improper line selection results in a loss of detection power and analytical errors.…”

Section: Spectral Interference By Matrixmentioning

confidence: 99%

Use of vertically resolved plasma emission as an indicator for flagging matrix effects and system drift in inductively coupled plasma-atomic emission spectrometry

Chan

Hieftje

2008

J. Anal. At. Spectrom.

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Vertically resolved measurement of analyte emission was investigated as an on-line indicator for flagging matrix effects and system drift in inductively coupled plasma-atomic emission spectrometry. The method is based on the fact that plasma behavior and excitation conditions are heterogeneous along the ICP vertical axis. As a result, the relative magnitude and even the direction of the change in emission intensity caused by a matrix effect or system drift are not constant, but are functions of observation height in the plasma. Since the determined concentration of an analyte in a sample is proportional to the measured intensity, any change in matrix effects or system drift along the vertical profile will similarly shift the determined concentration, allowing the drift or interference to be detected. It was verified that the new method can successfully flag matrix interferences caused by a change in plasma conditions (so-called plasma-related matrix effects), a change in sample aerosol generation or transport (so-called sample-introduction-related matrix effects) or spectral interference from emission lines of the matrix. Similarly, the method responded effectively to system drift caused by a change in sample throughput, central-channel gas flow and plasma forward power.

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Section: Spectral Interference By Matrixmentioning

confidence: 99%

Use of vertically resolved plasma emission as an indicator for flagging matrix effects and system drift in inductively coupled plasma-atomic emission spectrometry

Chan

Hieftje

2008

J. Anal. At. Spectrom.

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“…Spectral interferences are the most severe problems in the elaboration of ICP-AES methods [37][38][39][40][41]. The actual number of lines emitted from an ICP excitation source is much higher than the number of spectral lines listed in the classical tables [42,43].…”

Section: Spectral Interferences and Line Selectionmentioning

confidence: 99%

Analysis of yttrium aluminium borate crystals by solution-based methods: inductively coupled plasma atomic emission spectrometry and flame atomic absorption spectrometry

Bencs

Horváth

Varga

et al. 2004

Spectrochimica Acta Part B: Atomic Spectroscopy

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“…Although robust, this design is sensitive to interferences caused by strong spectral components -both from those that are directly detected and from those that fall outside the field-of-view and lights up the otherwise completely dark interior. This undesired light is usually referred to as stray light [7][8][9][10] and stems primary from scattering upon optics and dust as well as reflections on the inner walls. The error -manifested as an intensity offset -caused by stray light is often not significant in comparison to the intensity of a relatively intense spectral line, yet it leads to experimental difficulties monitoring weaker ones accurately.…”

Section: Introductionmentioning

confidence: 99%

High dynamic spectroscopy using a digital micromirror device and periodic shadowing

2017

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We present an optical solution called DMD-PS to boost the dynamic range of 2D imaging spectroscopic measurements up to 22 bits by incorporating a digital micromirror device (DMD) prior to detection in combination with the periodic shadowing (PS) approach. In contrast to high dynamic range (HDR), where the dynamic range is increased by recording several images at different exposure times, the current approach has the potential of improving the dynamic range from a single exposure and without saturation of the CCD sensor. In the procedure, the spectrum is imaged onto the DMD that selectively reduces the reflection from the intense spectral lines, allowing the signal from the weaker lines to be increased by a factor of 2⁸ via longer exposure times, higher camera gains or increased laser power. This manipulation of the spectrum can either be based on a priori knowledge of the spectrum or by first performing a calibration measurement to sense the intensity distribution. The resulting benefits in detection sensitivity come, however, at the cost of strong generation of interfering stray light. To solve this issue the Periodic Shadowing technique, which is based on spatial light modulation, is also employed. In this proof-of-concept article we describe the full methodology of DMD-PS and demonstrate - using the calibration-based concept - an improvement in dynamic range by a factor of ~100 over conventional imaging spectroscopy. The dynamic range of the presented approach will directly benefit from future technological development of DMDs and camera sensors.

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A century of spectral interferences in atomic emission spectroscopy — Can we master them with modern apparatus and approaches?

Cited by 55 publications

References 82 publications

Use of vertically resolved plasma emission as an indicator for flagging matrix effects and system drift in inductively coupled plasma-atomic emission spectrometry

Use of vertically resolved plasma emission as an indicator for flagging matrix effects and system drift in inductively coupled plasma-atomic emission spectrometry

Analysis of yttrium aluminium borate crystals by solution-based methods: inductively coupled plasma atomic emission spectrometry and flame atomic absorption spectrometry

High dynamic spectroscopy using a digital micromirror device and periodic shadowing

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