“…The methods (including the specimens preparation methods for electron microscope observation) and apparatus for the tests of field emission scanning electron microscopy (FE-SEM, Hitachi SU-8010, HITACHI, Tokyo, Japan), selected area electron diffraction (SAED, JEM-2100F, JEOL, Tokyo, Japan), transmission electron microscopy (TEM, Hitachi HT-7700, HITACHI, Tokyo, Japan), Raman spectrometer (HORIBA, Paris, France), X-ray photoelectron spectra (XPS, VG Escalab Mark 2, VG Instruments, Manchester, UK), and the N 2 adsorption-desorption analyses (Micromeritics ASAP-2020 analyzer, Micromeritics, Norcross, GA, USA) were conducted in similar ways in line with our previous report [30].…”