A CdTe Timepix3-based Sub-micron XCT System for Non-Destructive Testing

Roque, G.; Schütz, M. K.; Useche, J. S.; Fiederle, M.; Procz, S.

doi:10.1109/nss/mic/rtsd57108.2024.10656177

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2024 IEEE Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Confere 2024

DOI: 10.1109/nss/mic/rtsd57108.2024.10656177

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A CdTe Timepix3-based Sub-micron XCT System for Non-Destructive Testing

G. Roque,

M. K. Schütz,

J. S. Useche

et al.

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A CdTe Timepix3-based Sub-micron XCT System for Non-Destructive Testing

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References 8 publications

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