A Calibration Method for System Parameters in Direct Phase Measuring Deflectometry

Abstract

Phase measuring deflectometry has been widely studied as a way of obtaining the three-dimensional shape of specular objects. Recently, a new direct phase measuring deflectometry technique has been developed to measure the three-dimensional shape of specular objects that have discontinuous and/or isolated surfaces. However, accurate calibration of the system parameters is an important step in direct phase measuring deflectometry. This paper proposes a new calibration method that uses phase information to obtain the system parameters. Phase data are used to accurately calibrate the relative orientation of two liquid crystal display screens in a camera coordinate system, by generating and displaying horizontal and vertical sinusoidal fringe patterns on the two screens. The results of the experiments with an artificial specular step and a concave mirror showed that the proposed calibration method can build a highly accurate relationship between the absolute phase map and the depth data.