2015
DOI: 10.1109/jmems.2015.2451079
|View full text |Cite
|
Sign up to set email alerts
|

A Bulk-Micromachined Three-Axis Capacitive MEMS Accelerometer on a Single Die

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
5

Citation Types

0
20
0

Year Published

2016
2016
2024
2024

Publication Types

Select...
8
2

Relationship

0
10

Authors

Journals

citations
Cited by 66 publications
(23 citation statements)
references
References 20 publications
0
20
0
Order By: Relevance
“…Current state-of-the-art low g MEMS accelerometers are capable of sensing sub mg accelerations with noise densities of around 0.1 mg/Hz 1/2 or less. [3][4][5] A typical MEMS accelerometer proof-mass is roughly one microgram, meaning the devices are capable of resolving forces below 1 pN. Such force sensitivity is comparable to the performance of an atomic force microscope (AFM) but is realized on a single mm-scale chip and costs just tens of dollars per device.…”
Section: Introductionmentioning
confidence: 99%
“…Current state-of-the-art low g MEMS accelerometers are capable of sensing sub mg accelerations with noise densities of around 0.1 mg/Hz 1/2 or less. [3][4][5] A typical MEMS accelerometer proof-mass is roughly one microgram, meaning the devices are capable of resolving forces below 1 pN. Such force sensitivity is comparable to the performance of an atomic force microscope (AFM) but is realized on a single mm-scale chip and costs just tens of dollars per device.…”
Section: Introductionmentioning
confidence: 99%
“…Besides, this accelerometer could not differentiate accelerations of different axes and could not realize the axis direction of the applied acceleration. A three-axis accelerometer composed of three separate accelerometers was presented in (Tez et al 2015). This structure had three separate parts with around 0.4mm 2 surface area.…”
Section: Introductionmentioning
confidence: 99%
“…The basic principle of operation of a MEMS accelerometer is to measure the proof-mass displacement caused by the applied acceleration. Several technologies can be used to measure this displacement, such as capacitive technology [5][6][7], piezoelectric-based approaches [8], piezoresistive-sensing methods [9], and magnetic and optical techniques [10,11]. Each sensing technology not only provides several advantages but also suffers from some drawbacks.…”
Section: Introductionmentioning
confidence: 99%