2008
DOI: 10.1063/1.2832861
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A broadband method to measure magnetic spectra of thin films

Abstract: Conventional single-port strip-line techniques to measure permeability of thin films are based on the quasistationary approximation. In this paper, wave phenomena in the measurement cell are taken into account. Particularly, the dielectric response of the sample may be accounted for and removed by the consideration of the geometry of the cell and the sample. An additional measurement with a reference sample with known constitutive parameters allows the directivity error and the frequency response error to be r… Show more

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Cited by 35 publications
(35 citation statements)
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“…However, this technique is ill suited for conductive materials, particularly when the sample under study is a low-resistive film [1]. For metal films deposited on a flexible polymer substrate, coaxial line perturbation method has good performance [2].…”
Section: Introductionmentioning
confidence: 99%
“…However, this technique is ill suited for conductive materials, particularly when the sample under study is a low-resistive film [1]. For metal films deposited on a flexible polymer substrate, coaxial line perturbation method has good performance [2].…”
Section: Introductionmentioning
confidence: 99%
“…The effective permeability of both samples is measured with a stripline permeameter 17 in the frequency range of 0.13 to 4 GHz.…”
Section: The Experimental Detailsmentioning
confidence: 99%
“…The problem is that the measured washer samples are usually wound of film stripes, therefore the coaxial measurements are limited to flexible substrates and the obtained data are distorted by magnetostriction [5,6,10,11]. The stripe cells are calibrated less accurately and the measurements inherit the problems of radiation into surrounding space [4,7].…”
Section: Introductionmentioning
confidence: 99%
“…The SB-FMR technique is much more sensitive [2,3], the sample is uniformly magnetised but the calculated permeability data may differ from that ones obtained under zero bias and the technique is poorly suited for measurements within a range of frequencies. The SF-VNA measurements are performed under non-zero external bias as well [5,6], but the sensitivity of SF-VNA technique is much lower than that of SB-FMR one even in case of the resonance enhancement [7] as the measurement errors (the signal to noise ratio, SNR) are defined by calibration accuracy of a measurement cell [4]. The SF-VNA measurements are usually performed either in a coaxial line or in a strip-line.…”
Section: Introductionmentioning
confidence: 99%
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