2016 IEEE 20th Workshop on Signal and Power Integrity (SPI) 2016
DOI: 10.1109/sapiw.2016.7496314
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A big-data approach to handle process variations: Uncertainty quantification by tensor recovery

Abstract: Fabrication process variations are a major source of yield degradation in the nano-scale design of integrated circuits (IC), microelectromechanical systems (MEMS) and photonic circuits. Stochastic spectral methods are a promising technique to quantify the uncertainties caused by process variations. Despite their superior efficiency over Monte Carlo for many design cases, these algorithms suffer from the curse of dimensionality; i.e., their computational cost grows very fast as the number of random parameters i… Show more

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Cited by 12 publications
(8 citation statements)
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“…In side channel analysis [7]- [13], the impacts of HTs (e.g., circuit delay, transient current, leakage power and heat analysis) are used to detect whether there are the HTs in CUD. However, the characteristics of circuit is more susceptible to process variations and environmental noise due to the present nanoscale technologies [14].…”
Section: Related Workmentioning
confidence: 99%
“…In side channel analysis [7]- [13], the impacts of HTs (e.g., circuit delay, transient current, leakage power and heat analysis) are used to detect whether there are the HTs in CUD. However, the characteristics of circuit is more susceptible to process variations and environmental noise due to the present nanoscale technologies [14].…”
Section: Related Workmentioning
confidence: 99%
“…, z m ] with z k = A, W k , one may find that many elements of z are close to zero. To exploit the low-rank and sparse properties simultaneously, the following optimization problem [98], [99] may be solved:…”
Section: B Regularized Tensor Completionmentioning
confidence: 99%
“…Low-rank tensor approximation has shown promising performance in solving high-dimensional uncertainty quantification problems [24][25][26][27][28][29]. By low-rank tensor decomposition, one may reduce the number of unknown variables in uncertainty quantification to a linear function of the parameter dimensionality.…”
Section: Introductionmentioning
confidence: 99%