A Beginner’s Guide to LPM Materials Properties Measurements

Burnham, Nancy A.; Kulik, Andrzej; Oulevey, F.; Mayencourt, C.; Gourdon, Delphine; Dupas, E.; Gremaud, G.

doi:10.1007/978-94-011-5646-2_34

Cited by 14 publications

(8 citation statements)

References 55 publications

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“…Several models of contact mechanics for elastic contact of solid surfaces can be used for evaluation of the work of adhesion. These models account in different ways for various contributions such as elastic deformation, adhesion, and variation of the contact area. ,,− Various scenarios can take place depending upon parameters of interacting surfaces . For example, Hertzian behavior is generally observed for high loads and low surface forces.…”

Section: Resultsmentioning

confidence: 99%

Adhesive and Friction Forces between Chemically Modified Silicon and Silicon Nitride Surfaces

1998

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We report the results of probing adhesion and friction forces between surfaces with functional terminal groups with chemically modified scanning probe microscopy (SPM) tips. Surfaces with terminal groups of CH3, NH2, and SO3H were obtained by direct chemisorption of silane-based compounds on silicon/silicon nitride surfaces. We studied surface properties of the resulting self-assembled monolayers (SAMs) in air and aqueous solutions with different pHs. Work of adhesion, “residual forces”, and friction coefficients was obtained for four different types of modified tips and surfaces. Absolute values of the work of adhesion between various surfaces, W ad, were in the range 0.5−8 mJ/m2. The work of adhesion for different modified surfaces correlated with changes of solid−liquid surface energy estimated from macroscopic contact-angle measurements. Friction properties varied with pH in a register with adhesive forces showing a broad maximum at intermediate pH values for a silicon nitride/silicon nitride mating pair. Similar broad maxima were observed in the acid range for a NH2-terminated SAM and in the basic range for a SO3H-terminated SAM. This behavior can be understood considering the changes of the surface charge state determined by the zwitterionic nature of silicon nitride surfaces with multiple isoelectric points.

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Section: Resultsmentioning

confidence: 99%

Adhesive and Friction Forces between Chemically Modified Silicon and Silicon Nitride Surfaces

1998

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“…interest in nanotribology [2], and these properties provide crucial information to understand the origin and fundamental mechanism of friction and wear [3]. Through scanning probe microscopes such as the atomic force microscope (AFM) and lateral force microscope (LFM) or friction force microscope [4], to perform an experimental approach to the nanotribological regimen has been possible. LFM has a position sensitive photodetector (PSPD) which measures the lateral and vertical deflection of the cantilever simultaneously, detecting the friction and normal forces, respectively [5].…”

Section: Introductionmentioning

confidence: 99%

Determination of friction coefficient on ZrN and TiN using lateral force microscopy (LFM)

Arias

Marulanda

Baena

et al. 2006

Wear

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“…* Corresponding author These theories describe the interactions necessary to the understanding of the tip-sample system. The second concept is exemplified by the works of Burnham [14] and Rabe [15]. Their goal is to compare computer simulations with a real experiment.…”

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Influence of the topography on adhesion measured by SFM

Stifter¹,

Weilandt²,

Marti³

et al. 1998

Applied Physics A: Materials Science & Processing

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Surface properties such as adhesion are influenced by the surface topography. This dependency complicates any quantitative investigation of the material constants. A simple and efficient model is used to calculate the influence of the topography on the pull of force determined by a scanning force microscope (SFM). In the model the SFM tip is represented by a sphere. The sample surface is modeled by two geometries: a step on a plane and a blister (spherical cap) on a plane. The atomic interaction between the tip and the surface is of the Lennard-Jones type. The theoretical results are compared with SFM-measurements on highly oriented pyrolytic graphite (HOPG) in electrolytic environment. The calculations are in good agreement with the measured images.The SFM has become an indispensable tool for surface investigations on the nanometer scale. With the SFM it is possible to image the sample topography and properties such as friction [1-3], local stiffness [4], the adhesive force [5-8], and magnetic [9] and electrical forces [9]. In order to investigate these properties, specialized measurement modes are used. One main interest in SFM investigations is to determine macroscopic material constants, such as the friction coefficient, on a microscopic scale. It has been shown that this is very difficult. To determine the influence of material parameters on the measured signals the interaction between the tip and the sample has to be examined. Because material properties are often not directly accessible and the measured signal depends nonlinearly on various parameters, it is necessary to compare simulations and measurements.When formulating a theory, one can have two sometimes contradicting aims: either one focuses on the behavior of the interaction between the tip and the sample or one is interested in explaining the results of a specific experimental setup. The first concept is represented by the theories of Hertz [10], Johnson et al. [11], Derjaguin et al. [12], and Maugis [13]. * Corresponding author These theories describe the interactions necessary to the understanding of the tip-sample system. The second concept is exemplified by the works of Burnham [14] and Rabe [15].Their goal is to compare computer simulations with a real experiment. The model for the SFM typically consists of a sphere or point mass representing the tip and a plane representing the sample. However, these simplifications often make a comparison between the theoretical and the measured results impossible. For example, the representation of the surface by a plane is not sufficient if the calculations should describe the dependence on topographical changes. Investigating surface properties, e.g. the adhesive force, on a corrugated sample, one notices that SFM images show a change in the properties correlated with topographical features. The adhesive force often decreases strongly at slopes even if the height differences at the surface are rather small (see SFM images in Fig. 1).It is interesting to explore whether these variations in the adhesive fo...

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A Beginner’s Guide to LPM Materials Properties Measurements

Cited by 14 publications

References 55 publications

Adhesive and Friction Forces between Chemically Modified Silicon and Silicon Nitride Surfaces

Adhesive and Friction Forces between Chemically Modified Silicon and Silicon Nitride Surfaces

Determination of friction coefficient on ZrN and TiN using lateral force microscopy (LFM)

Influence of the topography on adhesion measured by SFM

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