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Encyclopaedia of Mathematics 1995
DOI: 10.1007/978-1-4899-3797-1_1
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“…Scanning probe microscopy (SPM) [1] is one of the main methods for studying the nanocrystalline material surfaces. However, materials with high relief surfaces, which are usually powder-like, porous and high-abrasive, are difficult to investigate using conventional SPM modes [2,3].…”
Section: Introductionmentioning
confidence: 99%
“…Scanning probe microscopy (SPM) [1] is one of the main methods for studying the nanocrystalline material surfaces. However, materials with high relief surfaces, which are usually powder-like, porous and high-abrasive, are difficult to investigate using conventional SPM modes [2,3].…”
Section: Introductionmentioning
confidence: 99%