A 70-Mev Synchrotron

Elder, F.R.; Gurewitsch, A. M.; Langmuir, R. V.; Pollock, H. C.

doi:10.1063/1.1697845

Cited by 59 publications

(6 citation statements)

References 13 publications

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“…The synchrotron working principle was shown during the Second World War by Oliphant (1943, University of Birmingham, UK). Three years later, it was shown for the first time (Goward & Barnes, 1946;Elder et al, 1947) that it is possible to built synchrotrons providing a satisfactory means of producing high energy electrons and X-rays. Nearly 70 years later, several synchrotrons of 3 rd generation are operational throughout the world and are of first necessity for all the scientists communities (Bilderback et al, 2005).…”

Section: Why Using Large Scale Facilities In Extreme Crystallography?mentioning

confidence: 99%

Recent Advances in Crystallography

Benedict¹

2012

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Dr Jason Benedict received his B.S. in Chemistry from Arizona State University in 2001. He completed his Ph.D. in Chemistry at the University of Washington in the laboratory of Professor Bart Kahr in 2007. His graduate work involved the optical characterization of anisotropic media including dyed crystals, spherulites, and poled polymers. He was a postdoctoral researcher with Professor Philip Coppens at the University at Buffalo from 2008-2011 developing time-resolved X-ray diffraction techniques as well as synthesizing and characterizing functionalized semiconductor nanoparticles. In 2011, Dr Benedict joined the Department of Chemistry at the University at Buffalo as an Assistant Professor where he is developing new 'in-house' time-resolved X-ray diffraction, imaging, and spectroscopic techniques and synthesizing novel molecular nanomaterials for a variety of materials science applications. ContentsPreface XI Section History of Crystallography 1Chapter Histories of Crystallography by Shafranovskii and Schuh 3 PrefaceThe advent of X-ray diffraction in the early twentieth century transformed crystallography from an area of scientific inquiry largely limited to physics, mineralogy, and mathematics, to a highly interdisciplinary field which now includes nearly all life and physical sciences as well as materials science and engineering. The atomic resolution structural information which is now routinely afforded by the combination of X-ray diffraction and crystallography is indispensable for the characterization of many modern materials, the interpretation of their function, and when applicable the rational improvement of their properties. Brighter X-ray sources and improved computing resources drive the evolution of new techniques for the characterization of increasingly exotic materials.This book is a collection of works showcasing some of the most recent developments in the field of crystallography. The history of a scientific field seldom accompanies a field's most recent technical advances between the same two covers. This collection, however, commences with a search for the elusive single narrative of the history of crystallography. Kahr and Shtukenberg introduce the reader to the numerous works which have attempted to describe the evolution of the study of crystals. Ultimately, the authors conclude that the independent narratives of Ilarion Ilarionovich Shafronovskii and Curtis Schuh provide the most comprehensive accounts of the history of crystallography to date and are 'unlikely to be surpassed for a very long time.' X Preface contribution of this section authored by Paradies and coworkers employs a wide variety of experimental techniques including X-ray scattering and diffraction as well as electron microscopy and diffraction on nanocrystals and crystalline colloids of Lipid A-diphosphate to unravel the structure of this biologically important molecule.Crystals as functional materials drives the field of crystal engineering which seeks to create solid-state structures with targeted physical and chemical pr...

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Section: Why Using Large Scale Facilities In Extreme Crystallography?mentioning

confidence: 99%

Recent Advances in Crystallography

Benedict¹

2012

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“…However, some experimental investigations of the properties of the synchrotron radiation were carried out in the late 1940's [17][18][19][20], and opened the way to characterisation by spectroscopy using synchrotrons [21,22]. During the 1970's, as new storage rings were built for highenergy physics research (for example, DCI and ACO in France) and as the interest for this type of research increased, more and more studies, implying synchrotron radiation and based on a growing number of techniques, began.…”

Section: Synchrotron and Synchrotron Radiation: A Short Historical Rementioning

confidence: 99%

Synchrotron Radiation and Oil Industry Research

Lynch

2005

Oil & Gas Science and Technology - Rev. IFP

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-Rayonnement synchrotron et recherche dans l'industrie pétrolière-Du fait de ses propriétés particulières, le rayonnement synchrotron est un outil de caractérisation puissant permettant l'obtention d'informations spécifiques dans de nombreux domaines scientifiques et, en particulier, dans le domaine de l'industrie pétrolière. Cet article d'introduction au dossier « Utilisation des grands instruments analytiques dans l'industrie pétrolière » propose une approche rapide et concrète de l'outil synchrotron, de ses propriétés et de ses applications dans toute la chaîne pétrolière (du puit de pétrole aux produits raffinés).

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“…Since the discovery of X-rays, the light source has also progressed greatly from the X-ray tube. In particular, the appearance of synchrotron radiation [3] has offered a major opportunity. On the other hand, a major obstacle to utilizing X-rays as optics is that they do not bend (not refract).…”

Section: Introductionmentioning

confidence: 99%

The Early Days of R&D on EUV Lithography and Future Expectations

Haga

2018

J. Photopol. Sci. Technol.

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Extreme Ultraviolet Lithography (EUVL) is will soon be fully practically applicable to the high volume manufacture of semiconductor chips. This paper describes the establishment of soft X-ray or EUV optical technology utilizing multilayer optical elements and the early stages of research regarding its application as a lithographic technique. The technology was established through the demonstration of three fundamental properties of optics: imaging, interference, and polarization in the soft X-ray region by multilayer optical elements. In imaging optics, we have demonstrated EUVL's feasibility as a lithographic candidate by establishing a design employing two-aspherical mirror optics, processing the aspherical mirrors with a multilayer coating, devising an assembly technology for imaging optics, and realizing an illumination system for large exposure area. This result showing the possibility of large-area exposure constitutes an epoch that strongly promotes the practical application of EUVL. Also, at-wavelength metrology in the EUV wavelength region, such as mask inspection based on a Mirau interferometric microscope, or thin film analysis based on a soft X-ray ellipsometer has contributed greatly to the practical application of EUVL.

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A 70-Mev Synchrotron

Cited by 59 publications

References 13 publications

Recent Advances in Crystallography

Recent Advances in Crystallography

Synchrotron Radiation and Oil Industry Research

The Early Days of R&D on EUV Lithography and Future Expectations

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