Abstract:A general analytical model has been developed to calculate particle transport and spatial step coverage evolution within 2-dimensional and 3-dimensional microelectronic device structures during low-pressure chemical vapor deposition. The model can account for spatially dependent nonunity reactive ‘‘sticking probabilities,’’ anisotropic source fluxes, and trench ‘‘shadowing’’ effects. There is no restriction on the initial and evolving shape of the structure. Model results are compared to direct Monte Carlo sim… Show more
“…This process can induce a local averaging of the solid angles, improving the conformity. Nevertheless, several studies [31]- [35] previously demonstrated that the influence of the surface diffusion on the conformity is very low in most cases.…”
In this paper, homogeneous and dense silicon-based coatings have been deposited from hexamethyldisiloxane (HMDSO: Si 2 O(CH 3 ) 6 ) on patterned silicium in a Townsend dielectric barrier discharge operating at atmospheric pressure. A brief description of the physical mechanisms ruling the step coverage is first described, followed by a description of the atmospheric pressure plasma process used. The step coverage is discussed with regard to the aspect ratio of the patterned wafers. Coatings deposited in and after the discharge region have also been characterized to understand the influence of plasma activation. In order to understand the experimental results, numerical simulations have been performed using a simplified reactive transport model. These results provide information and first general insight on the physical mechanisms ruling the conformity of silicon-based films deposited with this technique.Index Terms-Atmospheric pressure Townsend discharge (APTD), dielectric barrier discharge (DBD), glow discharges, plasma-enhanced chemical vapor deposition (PECVD), reactive transport modeling, silicon oxide, step coverage.
“…This process can induce a local averaging of the solid angles, improving the conformity. Nevertheless, several studies [31]- [35] previously demonstrated that the influence of the surface diffusion on the conformity is very low in most cases.…”
In this paper, homogeneous and dense silicon-based coatings have been deposited from hexamethyldisiloxane (HMDSO: Si 2 O(CH 3 ) 6 ) on patterned silicium in a Townsend dielectric barrier discharge operating at atmospheric pressure. A brief description of the physical mechanisms ruling the step coverage is first described, followed by a description of the atmospheric pressure plasma process used. The step coverage is discussed with regard to the aspect ratio of the patterned wafers. Coatings deposited in and after the discharge region have also been characterized to understand the influence of plasma activation. In order to understand the experimental results, numerical simulations have been performed using a simplified reactive transport model. These results provide information and first general insight on the physical mechanisms ruling the conformity of silicon-based films deposited with this technique.Index Terms-Atmospheric pressure Townsend discharge (APTD), dielectric barrier discharge (DBD), glow discharges, plasma-enhanced chemical vapor deposition (PECVD), reactive transport modeling, silicon oxide, step coverage.
“…Most notable is the assumption of an equilibrium gas distribution that results in Eqs. (5) and (6) that we use above. In spite of this, the method is able to give correct results in many different cases and in particular it has been verified at high Knudsen numbers [1,17] where gas particle velocity distributions may deviate significantly from the equilibrium distribution.…”
“…For a finite triangle size, the matrix elements Tij are given as an integral, which cannot be solved analytically. Therefore, in cases where equation (3) and the procedure for the calculation of . 6.Qij lead to a significant error, the corresponding triangles i and j are each subdivided into smaller triangles.…”
Section: D Implementation Of the Cvd Modelmentioning
This paper outlines activities carried out at FhG-IIS-B and FhG-ISiT on the development of algorithms and physical models required for the accurate threedimensional simulation of topography and doping steps in semiconductor technology. The three-dimensional process simulation modules are being developed as parts of the SOLID and the PROMPT process simulation systems.
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