2021
DOI: 10.1109/access.2021.3060517
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A 24 GHz Microwave Sensor With Built-in Calibration Capability Designed in MMIC Technology

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Cited by 8 publications
(3 citation statements)
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“…Contact sensors reduce their lifespan which adds to their regular maintenance cost while being continuously used, or increases the supplement cost while carrying consumable and disposable parts [16,17]. Non-contact sensing as well as small size, compactness, low-cost design, and robust sensing significantly increase microwave sensor performance in complex permittivity measurements [18][19][20][21][22][23], while facilitating its integration into monolithic microwave integrated circuits (MMIC) [24][25][26]. These sensors take different topologies including split-ring resonator (SRR) [20] and complementary SRR (CSRR) [27,28].…”
Section: Introductionmentioning
confidence: 99%
“…Contact sensors reduce their lifespan which adds to their regular maintenance cost while being continuously used, or increases the supplement cost while carrying consumable and disposable parts [16,17]. Non-contact sensing as well as small size, compactness, low-cost design, and robust sensing significantly increase microwave sensor performance in complex permittivity measurements [18][19][20][21][22][23], while facilitating its integration into monolithic microwave integrated circuits (MMIC) [24][25][26]. These sensors take different topologies including split-ring resonator (SRR) [20] and complementary SRR (CSRR) [27,28].…”
Section: Introductionmentioning
confidence: 99%
“…The comparison showed that the proposed calibration provides accurate results, being very close to the ones obtained in the reference calibration using known calibration loads and to the reflection coefficients measured using commercial VNA. It is therefore seen that the presented procedure is particularly useful for systems in which the measurement circuitry is integrated with DUT with no possibility to precisely characterize calibration loads, and at most, coarse information regarding their reflection coefficient (e.g., simulation results) is given [25]. Furthermore, it can be seen that the model (1) used in the proposed calibration for one-port measurements is also valid for transmission (two-port) measurements, as discussed in [25].…”
Section: Discussionmentioning
confidence: 99%
“…It is therefore seen that the presented procedure is particularly useful for systems in which the measurement circuitry is integrated with DUT with no possibility to precisely characterize calibration loads, and at most, coarse information regarding their reflection coefficient (e.g., simulation results) is given [25]. Furthermore, it can be seen that the model (1) used in the proposed calibration for one-port measurements is also valid for transmission (two-port) measurements, as discussed in [25]. Hence, future works will be focused on the augmentation of the developed procedure on two-port measurements.…”
Section: Discussionmentioning
confidence: 99%