2001 IEEE International Solid-State Circuits Conference. Digest of Technical Papers. ISSCC (Cat. No.01CH37177)
DOI: 10.1109/isscc.2001.912683
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A 113 mm/sup 2/ 600 Mb/s/pin 512 Mb DDR2 SDRAM with vertically-folded bitline architecture

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Cited by 7 publications
(3 citation statements)
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“…Dense DRAM have smaller cell area, which is 6.6F 2 demonstrated by [15]. Although XPT MRAM cell is as small as 1.5F 2 [10], using the current Spin-Torque Transfer (STT) technology, the size of a 1T1J MRAM cell in this paper is 8.4F × 4.4F , which is 5.6X larger than the densest DRAM.…”
Section: Stacking Mram As Replacement Of Main Memorymentioning
confidence: 85%
“…Dense DRAM have smaller cell area, which is 6.6F 2 demonstrated by [15]. Although XPT MRAM cell is as small as 1.5F 2 [10], using the current Spin-Torque Transfer (STT) technology, the size of a 1T1J MRAM cell in this paper is 8.4F × 4.4F , which is 5.6X larger than the densest DRAM.…”
Section: Stacking Mram As Replacement Of Main Memorymentioning
confidence: 85%
“…Dynamic RAMs [1][2][3][4] basically consist out of a charge storing capacitor which is accessed via an array device (Fig. 2).…”
Section: Dynamic Ramsmentioning
confidence: 99%
“…The higher data rate, however, increases the junction temperature and causes thermal runaway in the worst case. In order to avoid the problem associated with increased data rate, JEDEC has standardized DDR-II SDRAM, targeting 533 Mb/s/pin at much lower supply voltage than DDR SDRAM and RAMBUS DRAM [4]- [6]. DDR-II SDRAM is specified to operate with 1.8-V supply voltage while DDR SDRAM and RAMBUS DRAM use 2.5-V supply voltage.…”
Section: Introductionmentioning
confidence: 99%