2000
DOI: 10.1023/a:1004625530034
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Cited by 48 publications
(39 citation statements)
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“…Similar modulation of the noise was seen in Device2. At a frequency of 45 Hz we obtain the charge noise q n as 6x10~6 eA/Hz, which is comparable to the best metallic SET devices reported to date [5]. Theoretically the minimum noise level for a SET is SQmin = /JCAfRq/Rr, where C is the total capacitance, Af the frequency range and RT is the tunneling resistance [6].…”
Section: Introductionsupporting
confidence: 70%
“…Similar modulation of the noise was seen in Device2. At a frequency of 45 Hz we obtain the charge noise q n as 6x10~6 eA/Hz, which is comparable to the best metallic SET devices reported to date [5]. Theoretically the minimum noise level for a SET is SQmin = /JCAfRq/Rr, where C is the total capacitance, Af the frequency range and RT is the tunneling resistance [6].…”
Section: Introductionsupporting
confidence: 70%
“…When a metallic island is connected to bulk electrodes with two tunnel junctions (SET), the current through the device at low bias (in the Coulomb blockade regime) was shown to be very sensitive to tiny changes in the island potential corresponding to offset charges of 10 −3 e or below [45,46]. The existence and the dynamics of offset charges were clearly identified in metal-based transistors made by electronic lithography techniques (typical island size is 1 µm) [45,47,48,49,50,51], in scanning tunneling spectroscopy measurements on individual and oxidized metallic grains of nanometer size [52,53] and in planar metal-based tunnel junctions [54,55]. In our experiments, the granular Al films are deposited on a thermally grown SiO 2 layer 100 nm thick.…”
Section: B Electrical Measurementsmentioning
confidence: 99%
“…The early experiments in [17] clearly show that the charge noise on close by islands are correlated. The conclusion drawn from this observation, that the charge noise stems mostly from sources in the substrate was further substantiated by [28]. This has important consequences, because it suggests that it is possible to engineer the environment for desired noise configurations.…”
mentioning
confidence: 55%
“…Indeed, analysis in [17] shows that high noise correlations can be achieved for properly designed geometry and layouts of the charge islands. Simple environment engineering was already successful [28,29] in various contexts.…”
mentioning
confidence: 99%