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Cited by 8 publications
(11 citation statements)
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“…Sulfur was present in trace quantities. The thickness of layers containing chemisorption products at the chromium surface was estimated from the attenuation of the intensity of lines Cr 2 p [1]. It amounted to 2.0-2.2 nm for the conditions under which chromium was in contact with solutions of organic substances at open-circuit potentials and to 2.3-2.5 nm, in the case of interaction in conditions of imposition of cathodic polarization.…”
Section: Methodsmentioning
confidence: 99%
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“…Sulfur was present in trace quantities. The thickness of layers containing chemisorption products at the chromium surface was estimated from the attenuation of the intensity of lines Cr 2 p [1]. It amounted to 2.0-2.2 nm for the conditions under which chromium was in contact with solutions of organic substances at open-circuit potentials and to 2.3-2.5 nm, in the case of interaction in conditions of imposition of cathodic polarization.…”
Section: Methodsmentioning
confidence: 99%
“…Values of ∆ E b (C-B j ) for the C1 s line [17] (R is the hydrocarbon radical; M is the metal ion; Y = OR, CH 3 ; m + n = 3) solvable into components. 1 The lines have peaks at 287.6 and 289.0 eV (Figs. 1a, 2a).…”
Section: Figures 1 Through 4 Show Experimental (Solid Lines)mentioning
confidence: 99%
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