2001
DOI: 10.1023/a:1011336726819
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Cited by 9 publications
(4 citation statements)
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“…The second factor is the influence of the second and backscattered electrons on the detected signal. In our work the factor is ruled out by changing the pulse mode unequally [11].…”
Section: The Novel Methods For Determining L S and τ In Sebiv Modementioning
confidence: 99%
See 1 more Smart Citation
“…The second factor is the influence of the second and backscattered electrons on the detected signal. In our work the factor is ruled out by changing the pulse mode unequally [11].…”
Section: The Novel Methods For Determining L S and τ In Sebiv Modementioning
confidence: 99%
“…The time decay of SEBIV signal in the first approximation can be described as the following formulae without considering surface recombination or when S = 0 [11]:…”
Section: The Novel Methods For Determining L S and τ In Sebiv Modementioning
confidence: 99%
“…Testicular specimens were fixed in 4% phosphate buffered glutaraldehyde (0.1 M, pH 7.4), then in phosphate-buffered 1% osmium tetroxide, dehydrated in graded alcohol, placed into amyl acetate, dried with liquid CO 2 under pressure with critical point dryer (E 3000) and coated with gold particles (Rau et al, 2001) The samples were examined under Jeol JSM-5200LV scanning electron microscope at the Electron Microscopic Unit, Faculty of Medicine, Tanta University, Egypt.…”
Section: Scanning Electron Microscopic Examinationmentioning
confidence: 99%
“…Then the specimens were dehydrated in serial dilutions of ethanol and placed into amyl acetate. The samples were then dried with liquid CO 2 and coated with gold particles [26]. The tongue sample mounting was performed on aluminum stubs and scanning examination was done under scanning electron microscopic examination (JEOL JSM-6510 LV electron microscope; Jeol Ltd, Tokyo, Japan; Faculty of Agriculture, Electron Microscope Research Unit, Al-Mansoura University, Egypt).…”
Section: Scanning Electron Microscopic Examinationmentioning
confidence: 99%