2013
DOI: 10.1002/j.2168-0159.2013.tb06374.x
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67.2: A Novel Driving Method to Compensate for RC Delay of Ultra‐Large Size and High Resolution Liquid Crystal Displays

Abstract: We propose a novel method to drive ultra-large size and high resolution LCD TV with a single-bank data driver scheme without severe image degradation. We could achieve a maximum luminance and uniformity to be 98cd/m 2 and 86%, respectively when gray 128 is displayed. This confirms excellent performance because the conventional dual-bank driver scheme achieves the counterparts to be 90cd/m 2 and 93%.

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Cited by 3 publications
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“…Figure shows the simulation results when the RC loads increased by 10% and the TFT performance was degraded by 20% simultaneously. Figure (b) shows that the proposed method is effective for the single‐bank driver scheme, because a uniformity of 89.8% and average luminance of 125 cd/m 2 were comparable to those for the dual‐bank driver case.There are many studies on the reliability of a‐Si TFT . The degradation of TFTs is caused by the bias stress at the gate of the TFT.…”
Section: Resultsmentioning
confidence: 99%
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“…Figure shows the simulation results when the RC loads increased by 10% and the TFT performance was degraded by 20% simultaneously. Figure (b) shows that the proposed method is effective for the single‐bank driver scheme, because a uniformity of 89.8% and average luminance of 125 cd/m 2 were comparable to those for the dual‐bank driver case.There are many studies on the reliability of a‐Si TFT . The degradation of TFTs is caused by the bias stress at the gate of the TFT.…”
Section: Resultsmentioning
confidence: 99%
“…Figure 10(b) shows that the proposed method is effective for the single-bank driver scheme, because a uniformity of 89.8% and average luminance of 125 cd/m 2 were comparable to those for the dual-bank driver case.There are many studies on the reliability of a-Si TFT. [14][15][16] The degradation of TFTs is caused by the bias stress at the gate of the TFT. Thin-film transistors in the pixel are used as switching devices and an AC bias is applied to the gate with very low duty cycle.…”
Section: Resultsmentioning
confidence: 99%
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