We propose a measurement method of ion impurity amounts of thermally activated delayed fluorescence (TADF) green dopant powders in a solution by applying a triangle voltage waveform and measuring a small displacement current that has been developed for screening and optimization of materials for thin‐film transistor‐liquid crystal displays (TFT‐LCDs). We found that there is a strong correlation between ion impurity and organic light‐emitting diode (OLED) lifetime, and we confirmed that the TADF green dopant, having a large number of ion impurity, has short OLED lifetime.