2022
DOI: 10.1002/sdtp.16008
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53.1: Invited Paper: Process optimization of passive matrix GaN Micro‐LED displays

Abstract: A passive matrix (PM) blue Micro light‐emitting diode (LED) device with 300 μm pixel size and 7/10/15/20/30/50/100 μm luminous area is designed. The 1 μm thick insulating layer composed of SiO2 is grown in four steps, which improves the quality of the insulating layer and reduces the risk of electrical leakage. The thick metal is used as the p lines and the n lines. The non‐conductive GaN is left as the structure underneath the p lines to alleviate the breakage of the p lines to improve the reliability of the … Show more

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Cited by 3 publications
(4 citation statements)
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References 17 publications
(13 reference statements)
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“…Completed devices were first tested to characterize leakage current as low leakage is essential for realizing functional passive matrix displays [15][16][17][18] . This test was carried out by applying a 0-30 V sweep across the ncontacts of adjacent test devices separated by trenches varying from 30 µm to 100 µm in width.…”
Section: Resultsmentioning
confidence: 99%
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“…Completed devices were first tested to characterize leakage current as low leakage is essential for realizing functional passive matrix displays [15][16][17][18] . This test was carried out by applying a 0-30 V sweep across the ncontacts of adjacent test devices separated by trenches varying from 30 µm to 100 µm in width.…”
Section: Resultsmentioning
confidence: 99%
“…The second approach allows for the theoretical use of a monolithic blue emitting GaN display, with some pixels converted to green and red emission by application of phosphors. In a monolithic GaN display, current leakage between pixels is an issue due to challenges in growing truly intrinsic, insulating u-GaN [13][14][15][16][17][18][19][20] . In a basic m x n passive matrix array which has m rows and n columns, m + n control signals are used to address the elements of the display.…”
Section: Introductionmentioning
confidence: 99%
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“…Compared with FPGA, it is more convenient to verify the quality of the PM device. Second, the PM device process technology has also been optimized by adding the GaN as the substrate to avoid the bulging of the p-lines, resulting in the successful preparation of the PM device with excellent performance [14]. Section 3 adopts the row-column integration and two-wire serial transmission, which avoids high contrast and cross-version coupling.…”
Section: Introductionmentioning
confidence: 99%