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Wu-zhou, HE; Yuan, Mingshun

doi:10.1023/a:1016366421928

Cited by 4 publications

(1 citation statement)

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“…Fatigue crack growth threshold is defined as the corresponding value of stress intensity factor range K ∆ when the crack growth rate satisfies . Currently, many researchers have proposed their study on threshold fitting methods [1][2][3][4][5][6][7][8]. In this paper, the method to calculate the threshold was proposed.…”

Section: Introductionmentioning

confidence: 99%

Statistical Analysis of Fatigue Crack Growth Threshold Based on Test Data

Liu

Kong

et al. 2011

AMM

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Statistical analyses on fatigue crack growth threshold under three different stress ratios have been done. By the stratified random sampling theory and the weighted least square fitting method, the test data were analyzed based on Paris crack growth rate formulation. The statistical results of the fatigue crack growth threshold under different stress ratios were obtained by linear fitting method. The results show that the fatigue crack growth threshold is influenced by stress ratio R significantly. In the slow crack growth area near the threshold, the increase of stress ratio leads to the decrease of threshold and the increase of crack growth speed. The threshold results under different stress ratios satisfy the normal distribution.

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Section: Introductionmentioning

confidence: 99%

Statistical Analysis of Fatigue Crack Growth Threshold Based on Test Data

Liu

Kong

et al. 2011

AMM

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Analysis on the focal spot characteristics of random Gauss phase plate

Yang¹

2017

Optik

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On the Joint Distribution of Excursion Duration and Amplitude of a Narrow-Band Gaussian Process

et al. 2018

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The probability density of crest amplitude and duration that exceeds a given level is used in many theoretical and practical problems in engineering that are subjected to fluctuating loads such as wind and wave loads. The presently available joint distributions of amplitude and period are limited to excursion through a mean-level or to describe the asymptotic behavior of high level excursions. This paper extends the knowledge by presenting a theoretical derivation of probability of wave exceedance amplitude and duration for a stationary narrow-band Gaussian process. A density function is suggested that has the salient feature to depend only on the three lowest spectral moments m 0 , m 1 , and m 2 and desired level of exceedance, H . It does not require any condition on the autocorrelation function. This paper shows how increase in H , increases the correlation between excursion periods and amplitude. This paper also shows that how the accuracy of the proposed joint distribution relates to spectral width parameter, ν, and that accuracy increases for higher levels of H , especially for a spectrum describing a physical phenomenon such as a sea state spectrum. It was demonstrated that the marginal distribution of amplitude is Rayleigh distributed, as expected, and that the marginal distribution of excursion duration works for asymptotic and non-asymptotic levels. Results demonstrate that the established distribution fits well with ideal narrow-band Gaussian processes as well as the sea states at three European sites -in the Atlantic Ocean and the North Sea. The suggested model is found to be a good replacement for the existing empirical distributions.INDEX TERMS Stationary process, Gaussian narrow-band process, joint distribution, excursion duration, crest amplitude, level crossing.

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Cited by 4 publications

References 0 publications

Statistical Analysis of Fatigue Crack Growth Threshold Based on Test Data

Statistical Analysis of Fatigue Crack Growth Threshold Based on Test Data

Analysis on the focal spot characteristics of random Gauss phase plate

On the Joint Distribution of Excursion Duration and Amplitude of a Narrow-Band Gaussian Process

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