52.3: Mechanism of Perforated Encapsulation Failure in Reliability Test of Foldable Display

Abstract

As flexible OLED technology continues to mature, new technologies such as folding screens and in‐screen punching have been widely used in many fields such as mobile phones and portable laptops. Overlapping application of new technologies meets the needs of consumers and provides competitive products for the market, but also puts forward higher requirements for product reliability. In this research, the mechanism of dark spot caused by encapsulate failure in perforated area of foldable display screen in reliability test was systematically studied. Under the action of water vapor and electricity, the K element in the polarizer reacts electrochemically to generate KOH, which further generates K2SiO3 chemically with SiO2 of CVD encapsulation layer, resulting in the expansion of CVD film and encapsulation failure. Water vapor denatures the organic luminescent materials, dark spots appear.