500 KV GIL Fault Location Based on Single Terminal Transient Monitoring in Field Takeover Test

Zhang, Lin; Gong, Junqiang; Luo, Zhiyi; Zhang, Fan; Cheng, Jian; Li, Gen; Zheng, Yu

doi:10.1007/978-981-99-3408-9_101

Lecture Notes in Electrical Engineering

2023

DOI: 10.1007/978-981-99-3408-9_101

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500 KV GIL Fault Location Based on Single Terminal Transient Monitoring in Field Takeover Test

Lin Zhang,

Junqiang Gong,

Zhiyi Luo

et al.

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500 KV GIL Fault Location Based on Single Terminal Transient Monitoring in Field Takeover Test

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