2014
DOI: 10.1063/1.4893576
|View full text |Cite
|
Sign up to set email alerts
|

50% continuous-wave wallplug efficiency from 1.53μm-emitting broad-area diode lasers

Abstract: Articles you may be interested inContinuous wave operation of current injected GaN vertical cavity surface emitting lasers at room temperature Appl. Phys. Lett. 97, 071114 (2010); 10.1063/1.3483133 Room temperature operated 3.1 m type-I GaSb-based diode lasers with 80 mW continuous-wave output power Appl. Phys. Lett. 92, 171111 (2008); 10.1063/1.2919720 GaAs-based room-temperature continuous-wave 1.59 m GaInNAsSb single-quantum-well laser diode grown by molecular-beam epitaxy Appl. Phys. Lett. Design considera… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1

Citation Types

0
3
0

Year Published

2015
2015
2024
2024

Publication Types

Select...
7

Relationship

0
7

Authors

Journals

citations
Cited by 21 publications
(3 citation statements)
references
References 25 publications
0
3
0
Order By: Relevance
“…It is noted that the T 0 values, obtained here, are generally small due to inherently weak carrier confinement at the interface between AlInGaAs SCH and InP cladding layer as well as that of AlInGaAs SCH and InGaAs QW [27][28] and due to Auger recombination [29]. Therefore, together with optimization in the heterostructure, T 0 and T 1 can be somewhat improved [30]. In addition, a significant blue shift in the lasing wavelength was observed from the device grown on Si substrate (λ lasing = 1623 nm), while the devices grown on either InP or GaAs substrates exhibit similar lasing wavelength (λ lasing = 1652 ∼ 1654 nm), as shown in Fig.…”
Section: Resultsmentioning
confidence: 63%
“…It is noted that the T 0 values, obtained here, are generally small due to inherently weak carrier confinement at the interface between AlInGaAs SCH and InP cladding layer as well as that of AlInGaAs SCH and InGaAs QW [27][28] and due to Auger recombination [29]. Therefore, together with optimization in the heterostructure, T 0 and T 1 can be somewhat improved [30]. In addition, a significant blue shift in the lasing wavelength was observed from the device grown on Si substrate (λ lasing = 1623 nm), while the devices grown on either InP or GaAs substrates exhibit similar lasing wavelength (λ lasing = 1652 ∼ 1654 nm), as shown in Fig.…”
Section: Resultsmentioning
confidence: 63%
“…This low efficiency is attributed to a few factors, such as (1) the low conversion efficiency from electricity to photons (wall-plug efficiency), (2) photon losses in the reactors due to radiation scattering, (3) the fraction of the absorbed photons that results in the production of e -/h + pairs, and (4) the high rate of e -/h + recombination in the catalyst. The low conversion efficiency from electricity to photons may be improved by advances in electrical engineering (Garrod et al, 2014), such as the development of highly efficient LED light sources, while the reduction of the rate of recombination of electrons and holes is one of the primary goals of material scientists working on new photocatalysts (e.g., Z-scheme heterojunctions, plasmonic, defects engineering, element doping etc.) (Wang et al, 2018).…”
Section: Efficient Reactors For Pwtmentioning
confidence: 99%
“…This parameter has been widely recognized and applied over the past 50 years [13], [14]. At the same time, the use of characteristic temperature can predict the continuous operation performance of the device to a certain extent, helping us optimize the device [5].…”
Section: Introductionmentioning
confidence: 99%