4D-Data Acquisition in Scanning Confocal Electron Microscopy for Depth-Sectioned Imaging

Hamaoka, Takumi; Hashimoto, Ayako; Mitsuishi, Kazutaka; Takeguchi, Masaki

doi:10.1380/ejssnt.2018.247

Cited by 7 publications

(4 citation statements)

References 60 publications

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“…As a special type of segmented detectors, pixelated detectors provide an ultimate detector form for STEM imaging that incorporates the full range of reciprocal space information. Such detectors enable a versatile 4D‐STEM imaging mode, which is comprised of full diffraction (i.e., CBED) patterns, containing important information on the crystal structure,272 chemical composition,273 electric fields,274 defects/disorder,275 and strains,276–278 etc., for each probe position ( Figure ) 267,279,280…”

Section: Technological and Methodological Innovationsmentioning

confidence: 99%

Imaging Beam‐Sensitive Materials by Electron Microscopy

et al. 2020

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Electron microscopy allows the extraction of multidimensional spatiotemporally correlated structural information of diverse materials down to atomic resolution, which is essential for figuring out their structureproperty relationships. Unfortunately, the high-energy electrons that carry this important information can cause damage by modulating the structures of the materials. This has become a significant problem concerning the recent boost in materials science applications of a wide range of beam-sensitive materials, including metal-organic frameworks, covalent-organic frameworks, organicinorganic hybrid materials, 2D materials, and zeolites. To this end, developing electron microscopy techniques that minimize the electron beam damage for the extraction of intrinsic structural information turns out to be a compelling but challenging need. This article provides a comprehensive review on the revolutionary strategies toward the electron microscopic imaging of beamsensitive materials and associated materials science discoveries, based on the principles of electron-matter interaction and mechanisms of electron beam damage. Finally, perspectives and future trends in this field are put forward. he worked as a postdoctoral fellow and research scientist at King Abdullah University of Science and Technology. His research interests now focus on low-dose electron microscopy and structural elucidation of beam-sensitive materials for applications such as catalysis, gas separation, and energy conversion/storage.

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Section: Technological and Methodological Innovationsmentioning

confidence: 99%

Imaging Beam‐Sensitive Materials by Electron Microscopy

et al. 2020

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“…SCEM depth-sectioning measurements can also be performed using 4D-STEM. Hamaoka et al (2018) demonstrated that by using an annular aperture below the specimen and recording the full diffraction pattern, 3D information from the sample could be obtained using virtual ring detectors.…”

Section: Real-space 4d-stemmentioning

confidence: 99%

Four-Dimensional Scanning Transmission Electron Microscopy (4D-STEM): From Scanning Nanodiffraction to Ptychography and Beyond

2019

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Scanning transmission electron microscopy (STEM) is widely used for imaging, diffraction, and spectroscopy of materials down to atomic resolution. Recent advances in detector technology and computational methods have enabled many experiments that record a full image of the STEM probe for many probe positions, either in diffraction space or real space. In this paper, we review the use of these four-dimensional STEM experiments for virtual diffraction imaging, phase, orientation and strain mapping, measurements of medium-range order, thickness and tilt of samples, and phase contrast imaging methods, including differential phase contrast, ptychography, and others.

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“…One of the potentials of SCEM is to reveal the 3D information on the sample without the need for sample tilting, as SCEM improves the depth resolution. The depth-sectioning measurements can be performed by placing a pinhole aperture at a conjugate plane that can block electrons outside the focal plane, akin to the working mechanism of confocal optical microscopy . Comparing to electron tomography, SCEM also faces challenges such as achieving a high spatial resolution, penetration depth, and a large field of view.…”

Section: Local Structural Order and Defects Characterized By Electron...mentioning

confidence: 99%

“…The depth-sectioning measurements can be performed by placing a pinhole aperture at a conjugate plane that can block electrons outside the focal plane, akin to the working mechanism of confocal optical microscopy. 279 Comparing to electron tomography, SCEM also faces challenges such as achieving a high spatial resolution, penetration depth, and a large field of view. Note that all these electron diffraction techniques can further be integrated with the atomic pair distribution function (PDF) analysis to quantify structurally disordered materials in terms of short-and medium-range ordering.…”

Section: Introduction To Electron Diffraction Techniquesmentioning

confidence: 99%

Electron Microscopy Studies of Soft Nanomaterials

et al. 2023

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This review highlights recent efforts on applying electron microscopy (EM) to soft (including biological) nanomaterials. We will show how developments of both the hardware and software of EM have enabled new insights into the formation, assembly, and functioning (e.g., energy conversion and storage, phonon/photon modulation) of these materials by providing shape, size, phase, structural, and chemical information at the nanometer or higher spatial resolution. Specifically, we first discuss standard real-space two-dimensional imaging and analytical techniques which are offered conveniently by microscopes without special holders or advanced beam technology. The discussion is then extended to recent advancements, including visualizing three-dimensional morphology of soft nanomaterials using electron tomography and its variations, identifying local structure and strain by electron diffraction, and recording motions and transformation by in situ EM. On these advancements, we cover state-of-the-art technologies designed for overcoming the technical barriers for EM to characterize soft materials as well as representative application examples. The even more recent integration of machine learning and its impacts on EM are also discussed in detail. With our perspectives of future opportunities offered at the end, we expect this review to inspire and stimulate more efforts in developing and utilizing EM-based characterization methods for soft nanomaterials at the atomic to nanometer length scales in academic research and industrial applications.

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4D-Data Acquisition in Scanning Confocal Electron Microscopy for Depth-Sectioned Imaging

Cited by 7 publications

References 60 publications

Imaging Beam‐Sensitive Materials by Electron Microscopy

Imaging Beam‐Sensitive Materials by Electron Microscopy

Four-Dimensional Scanning Transmission Electron Microscopy (4D-STEM): From Scanning Nanodiffraction to Ptychography and Beyond

Electron Microscopy Studies of Soft Nanomaterials

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