Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) 2014
DOI: 10.1109/ipfa.2014.6898130
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40nm NAND flash reliability failure analysis with identification tools combination

Mei Ying Hsiao
1
,
Yi Heng Chen
2
,
Ling Kuey Yang
3
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