2018 IEEE International Memory Workshop (IMW) 2018
DOI: 10.1109/imw.2018.8388777
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40 nm Ultralow-Power Charge-Trap Embedded NVM Technology for IoT Applications

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Cited by 8 publications
(3 citation statements)
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“…Table II summarizes the features of the read operations among NVMs. In comparison with the 28 nm SONOS eFLASH, 27) the NBNVM achieves much larger operation voltage range, 54% reduction of the measured read energy 02SP59-3 © 2024 The Japan Society of Applied Physics per bit and 26% reduction of the access time at 1.05 V. Compared to the 28 nm ReRAM with a high-K cell transistor, 26) the NBNVM achieves a 71% reduction in the measured minimum read energy per bit, but it has approximately twice the access time at 0.85 V.…”
Section: Performance Evaluationmentioning
confidence: 99%
See 1 more Smart Citation
“…Table II summarizes the features of the read operations among NVMs. In comparison with the 28 nm SONOS eFLASH, 27) the NBNVM achieves much larger operation voltage range, 54% reduction of the measured read energy 02SP59-3 © 2024 The Japan Society of Applied Physics per bit and 26% reduction of the access time at 1.05 V. Compared to the 28 nm ReRAM with a high-K cell transistor, 26) the NBNVM achieves a 71% reduction in the measured minimum read energy per bit, but it has approximately twice the access time at 0.85 V.…”
Section: Performance Evaluationmentioning
confidence: 99%
“…[18][19][20][21][22][23] A 65 nm MCU with embedded NB non-volatile memory (NBNVM) has achieved dramatically read energy reduction over the designs equipped with the other NVMs. 24) In the conference extended abstract, 25) we developed a 28 nm NBNVM for further performance improvement and demonstrate its superiority by comparisons with a ReRAM 26) and a commercial SONOS (Silicon Oxide Nitride Oxide Silicon) eFLASH 27) at the same technology node. Moreover, we integrated it in a 32 bit RISC-V MCU and showed correct operation by measured waveforms.…”
Section: Introductionmentioning
confidence: 99%
“…All energy and area estimates are based on SONOS arrays and peripheral circuits that are designed and simulated in an embedded 40nm process compatible with SONOS memory [4,35]. The energy consumption of the array and row drivers is based on the average cell conductances in Fig.…”
Section: Mvm Core Designmentioning
confidence: 99%