2011
DOI: 10.1889/1.3621289
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4.2: Integrated Scan Driver with Oxide TFTs Using Floating Gate Method

Abstract: An on-glass integrated scan driver is proposed for oxide thin film transistors (TFTs) with negative threshold voltage. A coupling capacitor and a TFT for setting the initial voltage to the gate of a TFT were added to minimize the off-state current. Simulated and measured results indicate that the proposed scan driver shows no ripple and fast rise time/fall time of scan outputs. Circuit operation was verified with a 14-inch AMOLED panel.

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Cited by 30 publications
(21 citation statements)
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“…There are a few scan driver circuits integrated by MOTFTs using two negative power sources [7][8][9], series connected twotransistors (STT) structure with a feedback TFT [10], or floating gate method [11] to solve the problems induced by the leakage current at V gs = 0. In this paper, we focus on optimizing the output module of scan driver since the output module occupies most of the power consumption and restricts the speed of the scan driver.…”
Section: Introductionmentioning
confidence: 99%
“…There are a few scan driver circuits integrated by MOTFTs using two negative power sources [7][8][9], series connected twotransistors (STT) structure with a feedback TFT [10], or floating gate method [11] to solve the problems induced by the leakage current at V gs = 0. In this paper, we focus on optimizing the output module of scan driver since the output module occupies most of the power consumption and restricts the speed of the scan driver.…”
Section: Introductionmentioning
confidence: 99%
“…Many researches have been done to make a scan driver integrated on display panels using oxide TFTs [4][5][6][7]. However, previously reported scan drivers adopted many external signals, such as seven [5,6] or eight signals [4].…”
mentioning
confidence: 99%
“…However, previously reported scan drivers adopted many external signals, such as seven [5,6] or eight signals [4]. Increasing the number of clock signals creates more power consumption due to increasing the number of transitions of clock signals and the necessity of large area for signal lines.…”
mentioning
confidence: 99%
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