“…The crystal structure of the as‐synthesized HTO and HTO@rGO was characterized by X‐ray diffraction (XRD), as shown in Figure 2A 61,62 . The strong diffraction peak located at 9.8°, 19.5°, 24.1°, 27.8°, 29.6°, 33.4°, and 39.0° are originated from (020), (040), (110), (130), (060), (031), and (051) planes of orthorhombic structure of HTO (JCPDS card No.…”