Advanced Silicon Carbide Devices and Processing 2015
DOI: 10.5772/61020
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3C-SiC — From Electronic to MEMS Devices

Abstract: Since decades, silicon carbide (SiC) has been avowed as an interesting material for highpower and high-temperature applications because of its significant properties including its wide bandgap energy and high temperature stability. SiC is also professed as an ideal candidate for microsystem applications due to its excellent mechanical properties and chemical inertia, making it suitable for harsh environments. Among the 250 different SiC polytypes, only 4H, 6H and 3C-SiC are commercially available. The cubic st… Show more

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Cited by 6 publications
(9 citation statements)
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“…Besides, 3C–SiC has a smaller band gap (2.2 eV), lower breakdown electric field strength, and higher electron mobility than all α‐SiC polytypes, which can be more favorable for applications in high temperature, high power, and high frequency electronic devices . The high‐purity low‐cost 3C–SiC is also commonly used for sintering superplasticity ceramics . More especially, cubic 3C–SiC is the most commonly used polytype of SiC in the nuclear fuel applications where 3C–SiC is inevitably in contact with H 2 O.…”
Section: Introductionmentioning
confidence: 99%
“…Besides, 3C–SiC has a smaller band gap (2.2 eV), lower breakdown electric field strength, and higher electron mobility than all α‐SiC polytypes, which can be more favorable for applications in high temperature, high power, and high frequency electronic devices . The high‐purity low‐cost 3C–SiC is also commonly used for sintering superplasticity ceramics . More especially, cubic 3C–SiC is the most commonly used polytype of SiC in the nuclear fuel applications where 3C–SiC is inevitably in contact with H 2 O.…”
Section: Introductionmentioning
confidence: 99%
“…Nevertheless, it is crucial to notice that the mechanical properties of SiC, such as its high Young’s modulus or the layer internal stresses, are in such cases largely affected, and may negatively impact vibrating MEMS structures. Indeed, the Young’s modulus (E) values obtained, through MEMS (clamped beams, membranes) structures, clearly indicate that E strongly depends on a crystalline structure or orientation, thicknesses and doping type and level (by at least a factor of 3, from 120 to 500 GPa) [ 21 , 24 , 142 , 143 , 144 , 145 , 146 , 147 ]. In particular, a strong dependence of the Young’s modulus from both point defects [ 24 ] and stacking faults [ 142 ] has been reported.…”
Section: Sic Memsmentioning
confidence: 99%
“…Many masks for RIE technologies have been tested as thick photoresists, or SiOx and Al 2 O 3 without convincing success. The most efficient mask seems to be the hard mask using Ni, which is related to its inertness to the species present in the plasmas used [ 21 ]. The RIE or ICP etching processes of SiC are nowadays still far from the performances that are possible on silicon (such as those provided by cryogenic or DRIE etching), both in terms of maximum depth and anisotropy.…”
Section: Sic Memsmentioning
confidence: 99%
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“…Silicon carbide (SiC) is recognized as an excellent material for power applications due to notable electrical properties but SiC is also an outstanding candidate for microelectromechanical systems (MEMS) thanks to its distinguished chemical and mechanical properties [1]. Therefore, sensors that are able to detect temperature, gas, and pressure in aerospace or the automotive field are potential applications of SiC-based devices [2][3][4]. The cubic 3C-SiC polytype is favoured for MEMS applications as it can be epitaxially grown on silicon (Si) substrates and thus offers a low-cost solution for SiC-based MEMS development coupled with the conventional Si technologies.…”
Section: Introductionmentioning
confidence: 99%