2002
DOI: 10.1023/a:1013398019677
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Cited by 19 publications
(1 citation statement)
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“…[19][20][21][22] Some reports have confirmed the materialization of photonic band gaps with etching in the ground plane, without modulating the width of the top side of the microstrip line. [23][24][25] The impedance (Z 0 ) and the effective dielectric constant (ε eff ) are estimated as described in Ref. 26 in terms of the width of the wide lines W w , width of the narrow lines W n , thickness t of the lines, and thickness h and dielectric constant ε r of the substrate, as shown in Fig.…”
Section: Experimental Methodsmentioning
confidence: 99%
“…[19][20][21][22] Some reports have confirmed the materialization of photonic band gaps with etching in the ground plane, without modulating the width of the top side of the microstrip line. [23][24][25] The impedance (Z 0 ) and the effective dielectric constant (ε eff ) are estimated as described in Ref. 26 in terms of the width of the wide lines W w , width of the narrow lines W n , thickness t of the lines, and thickness h and dielectric constant ε r of the substrate, as shown in Fig.…”
Section: Experimental Methodsmentioning
confidence: 99%