2010
DOI: 10.1016/j.engfailanal.2009.09.012
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3-D reconstruction by extended depth-of-field in failure analysis – Case study I: Qualitative fractographic investigation of fractured bolts in a partial valve

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Cited by 8 publications
(4 citation statements)
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“…The selection of the parameters of microscopy and image acquisition had the criterion of optimizing the parameters for extended depth-of-field method. These issues are explained in detail in a previous article[28]. It was used a Nikon-Eclipse LV150 microscope, a reflected Light microscope, with objective lenses for extended working distances Thus, all pictures throughout the sliding surfaces were acquired with spatial resolution of 1260 960 pixels, with a 50X objective (numerical aperture of 0.9) was used to obtain 500 total magnification under brightfield illumination, using green filter.…”
mentioning
confidence: 99%
“…The selection of the parameters of microscopy and image acquisition had the criterion of optimizing the parameters for extended depth-of-field method. These issues are explained in detail in a previous article[28]. It was used a Nikon-Eclipse LV150 microscope, a reflected Light microscope, with objective lenses for extended working distances Thus, all pictures throughout the sliding surfaces were acquired with spatial resolution of 1260 960 pixels, with a 50X objective (numerical aperture of 0.9) was used to obtain 500 total magnification under brightfield illumination, using green filter.…”
mentioning
confidence: 99%
“…The output of this method is a fully focused image and an elevation map where in Z axis is between 0–255 pixels. It is explained in detail in Hein et al 16…”
Section: Methodsmentioning
confidence: 99%
“…The output of this method is a fully focused image and an elevation map where in Z axis is between 0-255 pixels. It is explained in detail in Hein et al 16 Regions of the worn surface of the samples were pictured with a digital camera in an optical microscope at regular displacement intervals. In each of the regions, stacks of pictures were obtained with a vertical lens shift range between 1μm and 2μm.…”
Section: Optical Microscopy Image Acquisition and 3-d Topographic Rec...mentioning
confidence: 99%
“…Then, the depth of the pixel point P(x, y) can be solved by finding the maximum of F z : depth=argmaxfalse(Fzfalse),z1zzn.According to the focus measure method principle, 3D reconstruction based on this method is divided into the spatial and frequency domain methods. At present, several techniques based on the spatial domain method have been proposed, such as the shape from focus (SFF) method (Nakagawa & Nayar, ) under the assumption of a Gaussian defocus model, stack focuser method (Hein, ) and model‐based method (Aguet et al ., ). The problem of focus variation is regarded as a convolutional optimization problem of the object texture and shape by the space domain method.…”
Section: Related Workmentioning
confidence: 99%