Section: Formulation Of Direct Scattering Problemmentioning
confidence: 99%
“…It is required to determine the electrical parameters of arbitrarily shaped, inhomogeneous lossy dielectrics in a wide range of electromagnetic applications, such as fabrication of multilayered structures, non-destructive testing, biomedical applications, material test and measurements, microwave device analysis and design problems, etc [1]. It is possible to classify the solution techniques for the determination electrical parameters of a lossy dielectric into two basic categories as free space and waveguide methods.…”
mentioning
confidence: 99%
“…It is possible to classify the solution techniques for the determination electrical parameters of a lossy dielectric into two basic categories as free space and waveguide methods. In [1], it has been shown that a dyadic Green's function (DGF) based reconstruction algorithm is effective for the determination of three dimensional inhomogeneity of a lossy dielectric object loaded in a rectangular cross-section waveguide.…”
mentioning
confidence: 99%
“…In order to apply the similar approach used in [1], ftrst it is required to solve the direct scattering problem using dyadic Green's function of circular empty waveguide in order to validate the solution of the equation which is also used in the inverse algorithm. In literature, direct scattering problem is analyzed in circular waveguide for open metal objects [2] and to our knowledge, no existing research addresses the direct scattering problem for lossy dielectric objects, partially loaded in circular waveguide.…”
The general formulae and algorithms for direct scattering analysis of inhomogeneous lossy dielectric objects, arbitrarily loaded inside a circular waveguide is given by means of a dyadic Green's function (DGF) concept.The numerical results are based on the Method of Moments discretization for electric type DGF representation of empty circular waveguide.
l. INTRODUCTIONIt is required to determine the electrical parameters of arbitrarily shaped, inhomogeneous lossy dielectrics in a wide range of electromagnetic applications, such as fabrication of multilayered structures, non-destructive testing, biomedical applications, material test and measurements, microwave device analysis and design problems, etc [1]. It is possible to classify the solution techniques for the determination electrical parameters of a lossy dielectric into two basic categories as free space and waveguide methods. In [1], it has been shown that a dyadic Green's function (DGF) based reconstruction algorithm is effective for the determination of three dimensional inhomogeneity of a lossy dielectric object loaded in a rectangular cross-section waveguide.In this study, a basis for a similar algorithm is proposed for the inhomogeneous objects loaded in circular waveguide. In order to apply the similar approach used in [1], ftrst it is required to solve the direct scattering problem using dyadic Green's function of circular empty waveguide in order to validate the solution of the equation which is also used in the inverse algorithm. In literature, direct scattering problem is analyzed in circular waveguide for open metal objects [2] and to our knowledge, no existing research addresses the direct scattering problem for lossy dielectric objects, partially loaded in circular waveguide.
Section: Formulation Of Direct Scattering Problemmentioning
confidence: 99%
“…It is required to determine the electrical parameters of arbitrarily shaped, inhomogeneous lossy dielectrics in a wide range of electromagnetic applications, such as fabrication of multilayered structures, non-destructive testing, biomedical applications, material test and measurements, microwave device analysis and design problems, etc [1]. It is possible to classify the solution techniques for the determination electrical parameters of a lossy dielectric into two basic categories as free space and waveguide methods.…”
mentioning
confidence: 99%
“…It is possible to classify the solution techniques for the determination electrical parameters of a lossy dielectric into two basic categories as free space and waveguide methods. In [1], it has been shown that a dyadic Green's function (DGF) based reconstruction algorithm is effective for the determination of three dimensional inhomogeneity of a lossy dielectric object loaded in a rectangular cross-section waveguide.…”
mentioning
confidence: 99%
“…In order to apply the similar approach used in [1], ftrst it is required to solve the direct scattering problem using dyadic Green's function of circular empty waveguide in order to validate the solution of the equation which is also used in the inverse algorithm. In literature, direct scattering problem is analyzed in circular waveguide for open metal objects [2] and to our knowledge, no existing research addresses the direct scattering problem for lossy dielectric objects, partially loaded in circular waveguide.…”
The general formulae and algorithms for direct scattering analysis of inhomogeneous lossy dielectric objects, arbitrarily loaded inside a circular waveguide is given by means of a dyadic Green's function (DGF) concept.The numerical results are based on the Method of Moments discretization for electric type DGF representation of empty circular waveguide.
l. INTRODUCTIONIt is required to determine the electrical parameters of arbitrarily shaped, inhomogeneous lossy dielectrics in a wide range of electromagnetic applications, such as fabrication of multilayered structures, non-destructive testing, biomedical applications, material test and measurements, microwave device analysis and design problems, etc [1]. It is possible to classify the solution techniques for the determination electrical parameters of a lossy dielectric into two basic categories as free space and waveguide methods. In [1], it has been shown that a dyadic Green's function (DGF) based reconstruction algorithm is effective for the determination of three dimensional inhomogeneity of a lossy dielectric object loaded in a rectangular cross-section waveguide.In this study, a basis for a similar algorithm is proposed for the inhomogeneous objects loaded in circular waveguide. In order to apply the similar approach used in [1], ftrst it is required to solve the direct scattering problem using dyadic Green's function of circular empty waveguide in order to validate the solution of the equation which is also used in the inverse algorithm. In literature, direct scattering problem is analyzed in circular waveguide for open metal objects [2] and to our knowledge, no existing research addresses the direct scattering problem for lossy dielectric objects, partially loaded in circular waveguide.
“…Due to their relative simplicity, non-resonant waveguide coaxial transmission/reflection methods are presently the most widely used broadband measurement techniques [8]. Various non-resonant transmission-reflection methods have been proposed for electrical characterization of low-, medium-, and high-loss materials [9][10][11][12][13][14][15][16][17][18].…”
Abstract-Effective complex permittivity measurements of materials are important in microwave engineering and microwave chemistry. Artificial neural network (ANN) computational module has been used in microwave technology and becomes a useful tool recently. A neural network can be trained to learn the behavior of an effective permittivity of material under microwave irradiation in a test system, and it can provide a fast and accurate result for the permittivity measurement of material. Thus, an on-line measurement has been realized. This paper presents a simple and convenient reconstruction algorithm for determining the dielectric properties of materials. First, a measurement system is designed, and the reflection coefficient is calculated by employing full-wave simulations. Second, an artificial nerve network has been applied, and adequate simulated materials are utilized to train the networks. Last, the trained network is employed to reconstruct the effective permittivity of several organic solvents using the measured scattering parameters, and the reconstructed results for several organic solvents agree well with reference data and the relative errors between them are less than 5%.
We present a method aimed at reducing uncertainties and instabilities when characterizing materials in waveguide setups. The method is based on measuring the S parameters for three different orientations of a rectangular sample block in a rectangular waveguide. The corresponding geometries are modeled in a commercial full-wave simulation program, taking any material parameters as input. The material parameters of the sample are found by minimizing the squared distance between measured and calculated S parameters. The information added by the different sample orientations is quantified using the Cramér-Rao lower bound. The flexibility of the method allows the determination of material parameters of an arbitrarily shaped sample that fits in the waveguide.
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