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2010
DOI: 10.1109/tmtt.2010.2045528
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3-D Imaging of Inhomogeneous Materials Loaded in a Rectangular Waveguide

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Cited by 20 publications
(16 citation statements)
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“…Scattered field for the problem depicted in Fig. 1 can be formulated as [3] IS = iWJk, f C(;';:;)Je)dv' (1) rEI) 978-1-4673-4480-7/12/$31.00 ©2012 IEEE where G(r, r') and l(r) are the dyadic Green's function and volume current density function, respectively.…”
Section: Formulation Of Direct Scattering Problemmentioning
confidence: 99%
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“…Scattered field for the problem depicted in Fig. 1 can be formulated as [3] IS = iWJk, f C(;';:;)Je)dv' (1) rEI) 978-1-4673-4480-7/12/$31.00 ©2012 IEEE where G(r, r') and l(r) are the dyadic Green's function and volume current density function, respectively.…”
Section: Formulation Of Direct Scattering Problemmentioning
confidence: 99%
“…It is required to determine the electrical parameters of arbitrarily shaped, inhomogeneous lossy dielectrics in a wide range of electromagnetic applications, such as fabrication of multilayered structures, non-destructive testing, biomedical applications, material test and measurements, microwave device analysis and design problems, etc [1]. It is possible to classify the solution techniques for the determination electrical parameters of a lossy dielectric into two basic categories as free space and waveguide methods.…”
mentioning
confidence: 99%
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“…Due to their relative simplicity, non-resonant waveguide coaxial transmission/reflection methods are presently the most widely used broadband measurement techniques [8]. Various non-resonant transmission-reflection methods have been proposed for electrical characterization of low-, medium-, and high-loss materials [9][10][11][12][13][14][15][16][17][18].…”
Section: Introductionmentioning
confidence: 99%