“…During the surface roughness analysis, the root mean square (RMS) of the surface height was mostly used during the modeling [ 9 , 23 , 24 , 25 , 26 , 27 , 28 ]. On the other hand, analytical models were also used to study the surface roughness of the conductors, such as the gradient model [ 29 , 30 , 31 , 32 , 33 , 34 , 35 ], state-space formulation [ 33 ], Green’s function [ 36 , 37 , 38 ], fast Fourier transformation (FFT) [ 39 ], method of momentum (MoM) [ 40 ], small perturbation method [ 24 ], and Gaussian function from Campbell’s theorem [ 27 , 28 ]. Some other researchers added correction factors to change the smooth surface models to rough surface models [ 11 , 41 ].…”