2019
DOI: 10.1109/tap.2018.2878332
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3-D Electromagnetic Scattering From Multilayer Dielectric Media With 2-D Random Rough Interfaces Using <inline-formula> <tex-math notation="LaTeX">$T$ </tex-math> </inline-formula>-Matrix Approach

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Cited by 13 publications
(3 citation statements)
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“…During the surface roughness analysis, the root mean square (RMS) of the surface height was mostly used during the modeling [ 9 , 23 , 24 , 25 , 26 , 27 , 28 ]. On the other hand, analytical models were also used to study the surface roughness of the conductors, such as the gradient model [ 29 , 30 , 31 , 32 , 33 , 34 , 35 ], state-space formulation [ 33 ], Green’s function [ 36 , 37 , 38 ], fast Fourier transformation (FFT) [ 39 ], method of momentum (MoM) [ 40 ], small perturbation method [ 24 ], and Gaussian function from Campbell’s theorem [ 27 , 28 ]. Some other researchers added correction factors to change the smooth surface models to rough surface models [ 11 , 41 ].…”
Section: Introductionmentioning
confidence: 99%
“…During the surface roughness analysis, the root mean square (RMS) of the surface height was mostly used during the modeling [ 9 , 23 , 24 , 25 , 26 , 27 , 28 ]. On the other hand, analytical models were also used to study the surface roughness of the conductors, such as the gradient model [ 29 , 30 , 31 , 32 , 33 , 34 , 35 ], state-space formulation [ 33 ], Green’s function [ 36 , 37 , 38 ], fast Fourier transformation (FFT) [ 39 ], method of momentum (MoM) [ 40 ], small perturbation method [ 24 ], and Gaussian function from Campbell’s theorem [ 27 , 28 ]. Some other researchers added correction factors to change the smooth surface models to rough surface models [ 11 , 41 ].…”
Section: Introductionmentioning
confidence: 99%
“…Actually very few methods apply to the resonant domain [27,28] where roughness parameters are comparable to the illumination wavelength. The number of methods again decreases when the illuminated sample is a rough multilayer [29,30]. In this paper we present and use a boundary integral formalism for the electromagnetic wave scattering from rough multilayers [25].…”
Section: Introductionmentioning
confidence: 99%
“…Zamani et al [27] reported a perturbation approach, the extended boundary condition (EBC)-based SPM to study the scattering from inhomogeneous media with arbitrary dielectric profiles. A translation matrix (T-Matrix) solution to the 3-D EM scattering from the dielectric layered medium was proposed in [28].…”
mentioning
confidence: 99%