2016
DOI: 10.1002/adma.201603858
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Sub‐50 nm Channel Vertical Field‐Effect Transistors using Conventional Ink‐Jet Printing

Abstract: A printed vertical field-effect transistor is demonstrated, which decouples critical device dimensions from printing resolution. A printed mesoporous semiconductor layer, sandwiched between vertically stacked drive electrodes, provides <50 nm channel lengths. A polymer-electrolyte-based gate insulator infiltrates the percolating pores of the mesoporous channel to accumulate charge carriers at every semiconductor domain, thereby, resulting in an unprecedented current density of MA cm .

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Cited by 35 publications
(38 citation statements)
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References 33 publications
(48 reference statements)
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“…Current technological interests of organic VFETs are mainly focusing on organic thin film materials . But the inevitable large amount of defects and grain boundaries in organic thin films are inferior to efficient charge transport in devices.…”
mentioning
confidence: 99%
“…Current technological interests of organic VFETs are mainly focusing on organic thin film materials . But the inevitable large amount of defects and grain boundaries in organic thin films are inferior to efficient charge transport in devices.…”
mentioning
confidence: 99%
“…In this regard, vertical organic transistors with a channel length of ≈100 nm have generated significant interest in recent years, [4][5][6][7][8][9][10] as the vertical dimensions of an organic transistor can be easily controlled over the nanometer regime. Hence, new device concepts need to be conceived which allow for an ultra-short channel length in conjunction with low fabrication costs.…”
mentioning
confidence: 99%
“…There are also promising developments with regard to printed electronics and inorganic semiconductor materials. Baby et al successfully built a transistor with a vertical structure and a channel length of less than 50 nm . As ink, they used a metal–organic precursor which they printed on a prepatterned bottom electrode.…”
Section: Overview Over Device Principles and State‐of‐the‐artmentioning
confidence: 99%
“…e) Electron microscopy image of the mesoporous net semiconductor network. Reproduced with permission . Copyright 2017, Wiley‐VCH.…”
Section: Overview Over Device Principles and State‐of‐the‐artmentioning
confidence: 99%