2015
DOI: 10.1109/jphot.2015.2460116
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25-Gb/s 1310-nm Optical Receiver Based on a Sub-5-V Waveguide-Coupled Germanium Avalanche Photodiode

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Cited by 17 publications
(25 citation statements)
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“…However, [8] showed a Ge APD capable of 40 Gb/s NRZ at 3.4 V bias. Bit-error rate (BER) measurements were only performed for 10 Gb/s NRZ and indicated a relatively low estimated sensitivity of <-16.5 dBm at HD-FEC, at least 5 dB less than what the presented Ge APD in this paper achieved at twice the bitrate for NRZ [9].…”
Section: Introductioncontrasting
confidence: 57%
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“…However, [8] showed a Ge APD capable of 40 Gb/s NRZ at 3.4 V bias. Bit-error rate (BER) measurements were only performed for 10 Gb/s NRZ and indicated a relatively low estimated sensitivity of <-16.5 dBm at HD-FEC, at least 5 dB less than what the presented Ge APD in this paper achieved at twice the bitrate for NRZ [9].…”
Section: Introductioncontrasting
confidence: 57%
“…20 Gb/s and 25 Gb/s) as reported in [9], we can estimate the sensitivity penalty of doubling the bitrate through PAM-4 modulation. For 20 Gb/s a sensitivity (with respect to HD-FEC) of approximately -22 dBm of received optical power for a PRBS of 2 31 − 1 at an ER of 8.3 dB was obtained.…”
Section: Resultsmentioning
confidence: 97%
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“…The fabrication does not require complex implantation sequences to activate the semiconductor locally. In addition, there is no need for seeding layers to epitaxially grow crystalline materials on the waveguides for light detection or modulation, in contrast to the fabrication of Ge photodetectors [41,250] and SiGe or Ge electro-absorption modulators [60,251]. SLG integration reduces the complexity and the number of steps compared with 3D device integration [60,251], as well as the total temperature budget to integrate the active detector or modulator on the Si waveguides.…”
Section: Wafer-scale Integrationmentioning
confidence: 99%
“…Because of that, extra electronic stages with trans-impedance amplifiers (TIA) or limiting amplifiers (LA) are typically attached to the devices. Improved performance photo-detectors can be obtained by switching over to devices that exploit an internal multiplication gain 1,14,[40][41][42][43][44][45][46][47][48] , i.e. on-chip avalanche photodetectors (APDs).…”
Section: Introductionmentioning
confidence: 99%