Successful application of Low Voltage Electron Microscopy to practical materials problems

Bell, David C.; Mankin, Max; Day, Robert W.; Erdman, Natasha

doi:10.1016/j.ultramic.2014.03.005

Cited by 27 publications

(11 citation statements)

References 42 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Control of this factor is then of prime importance. There have been efforts to reduce the incident beam energy of aberration corrected electron microscopes (Bell et al, 2014). However changing the wavelength of the incoming electrons without reducing the number of them reaching the sample per unit time has a lower influence on the beam-sample mechanisms of interaction (Smith et al, 1986;Kisielowski et al, 2013).…”

Section: Resultsmentioning

confidence: 99%

Maintaining the genuine structure of 2D materials and catalytic nanoparticles at atomic resolution

Calderón¹,

Kisielowski

Specht³

et al. 2015

Micron

View full text Add to dashboard Cite

The recent development of atomic resolution, low dose-rate electron microscopy allows investigating 2D materials as well as catalytic nano particles without compromising their structural integrity. For graphene and a variety of nanoparticle compositions, it is shown that a critical dose rate exists of <100 e(-)/Å(2) s at 80 keV of electron acceleration that allows maintaining the genuine object structures including their surfaces and edges even if particles are only 3 nm large or smaller. Moreover, it is demonstrated that electron beam-induced phonon excitation from outside the field of view contributes to a contrast degradation in recorded images. These degradation effects can be eliminated by delivering electrons onto the imaged area, only, by using a Nilsonian illumination scheme in combination with a suitable aperture at the electron gun/monochromator assembly.

show abstract

Section: Resultsmentioning

confidence: 99%

Maintaining the genuine structure of 2D materials and catalytic nanoparticles at atomic resolution

Calderón¹,

Kisielowski

Specht³

et al. 2015

Micron

View full text Add to dashboard Cite

show abstract

“…Previously, using a lower voltage led to worse resolution, but the inventions of the C s corrector and monochromator as electron sources have solved this problem, and sufficient resolution (~0.1 nm) is possible with ~40 kV electron sources (Bell et al , 2012). Such a low voltage reduced radiation damage to graphene but increased such damage to zeolites (Bell et al , 2014), and clay minerals would probably show similar results to the latter. The reason for this difference is that the origins of the damage in graphene and zeolites are mainly knock-on and radiolytic effects, respectively.…”

Section: Recent Advances In High-resolution Imagingmentioning

confidence: 82%

Visualization of clay minerals at the atomic scale

Kogure

2020

Clay miner.

View full text Add to dashboard Cite

This review demonstrates that high-resolution transmission electron microscopy (HRTEM) imaging of clay minerals or phyllosilicates with an incident electron beam along the major zone axes parallel to the constituting layers, in which the contrast corresponds to individual cation columns in the images obtained, is indispensable for elucidating the enigmatic structures of these minerals. Several kinds of variables for layer stacking, including polytypes, stacking disorder and the interstratification of various kinds of unit layers or interlayer materials, are common in phyllosilicates. Local and rigorous determination of such variables is possible only with HRTEM, although examination as to whether the results obtained by the HRTEM images from limited areas represent the whole specimen should be made using other techniques, such as X-ray diffraction. Analysis of these stacking features in clay minerals provides valuable insights into their origin and/or formation processes. Recent state-of-the-art techniques in electron microscopy, including incoherent imaging, superior resolutions of ~0.1 nm and low-dose imaging using new recording media, will also contribute significantly to our understanding of the true structures of clay minerals.

show abstract

“…Lowering the electron energy from 80 keV and above in standard scanning transmission electron microscopy (STEM) experiments to 30 keV in scanning electron microscopes equipped with a STEM detector leads to the suppression of knock-on damage and contrast enhancement due to the increased scattering probability [1][2][3].…”

Section: Introductionmentioning

confidence: 99%

Imaging of polymer:fullerene bulk-heterojunctions in a scanning electron microscope: methodology aspects and nanomorphology by correlative SEM and STEM

Müller

Sprau

et al. 2020

Adv Struct Chem Imag

View full text Add to dashboard Cite

Scanning transmission electron microscopy (STEM) at low energies (≤ 30 keV) in a scanning electron microscope is well suited to distinguish weakly scattering materials with similar materials properties and analyze their microstructure. The capabilities of the technique are illustrated in this work to resolve material domains in PTB7:PC 71 BM bulk-heterojunctions, which are commonly implemented for light-harvesting in organic solar cells. Bright-field (BF-) and highangle annular dark-field (HAADF-) STEM contrast of pure PTB7 and PC 71 BM was first systematically analyzed using a wedge-shaped sample with well-known thickness profile. Monte-Carlo simulations are essential for the assignment of material contrast for materials with only slightly different scattering properties. Different scattering cross-sections were tested in Monte-Carlo simulations with screened Rutherford scattering cross-sections yielding best agreement with the experimental data. The STEM intensity also depends on the local specimen thickness, which can be dealt with by correlative STEM and scanning electron microscopy (SEM) imaging of the same specimen region yielding additional topography information. Correlative STEM/SEM was applied to determine the size of donor (PTB7) and acceptor (PC 71 BM) domains in PTB7:PC 71 BM absorber layers that were deposited from solution with different contents of the processing additive 1,8-diiodooctane (DIO).

show abstract

Successful application of Low Voltage Electron Microscopy to practical materials problems

Cited by 27 publications

References 42 publications

Maintaining the genuine structure of 2D materials and catalytic nanoparticles at atomic resolution

Maintaining the genuine structure of 2D materials and catalytic nanoparticles at atomic resolution

Visualization of clay minerals at the atomic scale

Imaging of polymer:fullerene bulk-heterojunctions in a scanning electron microscope: methodology aspects and nanomorphology by correlative SEM and STEM

Contact Info

Product

Resources

About