nanoparticle film, [7,11] the postdeposition film annealing temperature, [12] and the density of dopant ions in the ZnO NPs, [13,14] these works do not explain how the tunable electrical properties of ZnO nanoparticles themselves [15,16] may be exploited to enhance QLED performance.An important challenge arising from the architecture of QLEDs is balancing electron and hole injection into the thin QD layer. Due to the deep valence band energy of core-shell CdSe QDs, hole injection into a QD is expected to be less facile than electron injection. This causes a build-up of electrons in the QD layer, [4,7,17] reducing the device efficiency due to rapid nonradiative Auger recombination [18] or injection of electrons into the HTL. [19,20] Approaches taken to reduce the build-up of electrons in the QD film include selecting hole transport materials with smaller highest-occupied-molecular-orbital (HOMO) energies, [9] engineering the shell of the QDs to hinder electron injection, [17,[21][22][23] inserting the QD layer inside the HTL, [19,24] or inserting a thin layer of insulating polymer [4] or lower-mobility TiO 2[25] between the QD and ETL to hinder charge injection. Despite these advances, the development of alternative approaches to balance charge injection, which do not require modification of the energy levels or architecture of the device, are needed to diversify the range of materials and device architectures available for use in QLEDs.To this end, we have developed a method for balancing charge injection in QLED devices by tuning the electron mobility in the ZnO nanoparticle ETL without modification of the device architecture. This is achieved by employing a solution-phase annealing step prior to film deposition which, unlike postdeposition annealing steps, does not change the physical properties of the ZnO film such as thickness or density. In this way changes in the QLED performance can be unambiguously attributed to the measurable electrical properties of the ZnO film. The focus on the ZnO electron mobility is inspired by models of OLED devices which have demonstrated that the location of electron-hole recombination in a device is determined by the relative mobilities of holes and electrons. [26,27] In a QLED the QD film is typically 2-3 monolayers thick and so the position of recombination must be centered on this small region for maximum luminescence efficiency. Here, we show that the position of recombination and hence charge balance in the QD layer, varies with both electron mobility and device luminance. At the same time we address the need for Quantum-dot (QD) light-emitting diodes (QLEDs) are an important new class of optoelectronic device. Despite the ubiquity of ZnO as the electrontransport material in QLEDs, little is known about how its properties influence QLED performance. Here, it is demonstrated that the defect density and electron mobility of the ZnO nanoparticle electron-transport layer strongly affect QLED device efficiency and can be used to balance electron and hole injection into the QD l...