2013
DOI: 10.1166/jnn.2013.7619
|View full text |Cite
|
Sign up to set email alerts
|

Electrical and Optical Characteristics of <I>n</I>-ZnO/<I>p</I>-GaN Hetero-Junction Diode Fabricated by Ultra-High Vacuum Sputter

Abstract: We investigated the electrical and optical properties of n-ZnO/p-GaN hetero-junction diode fabricated by an ultra-high vacuum radio frequency magnetron sputter. A physical relationship between the rotation rate during deposition process and post annealing conditions after deposited ZnO layer on p-GaN layer was discussed. When the rotation rates during deposition process of n-ZnO layer were 5 rpm and 15 rpm, the full width at half maximum of photoluminescence spectra of ZnO layer on the p-GaN layer was about 10… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1

Citation Types

1
1
0

Year Published

2014
2014
2024
2024

Publication Types

Select...
2

Relationship

0
2

Authors

Journals

citations
Cited by 2 publications
(2 citation statements)
references
References 0 publications
1
1
0
Order By: Relevance
“…It is noticeable that the value of the non-ideality factor is found to be quite high in all cases. Note that high η values have often been reported for heterostructure devices [6,11,27,28] and attributed to barrier inhomogeneity, interface states, leakage due to tunnelling and non-uniform distribution of carriers at the interface [29,30]. Since all of our samples exhibit good epitaxial and interface qualities, it is unlikely that above factors are responsible for the high values of η obtained here.…”
Section: Electrical Propertiessupporting
confidence: 59%
See 1 more Smart Citation
“…It is noticeable that the value of the non-ideality factor is found to be quite high in all cases. Note that high η values have often been reported for heterostructure devices [6,11,27,28] and attributed to barrier inhomogeneity, interface states, leakage due to tunnelling and non-uniform distribution of carriers at the interface [29,30]. Since all of our samples exhibit good epitaxial and interface qualities, it is unlikely that above factors are responsible for the high values of η obtained here.…”
Section: Electrical Propertiessupporting
confidence: 59%
“…Many groups have reported the * Author to whom any correspondence should be addressed. fabrication of n-ZnO/p-GaN junction based LEDs, where various growth techniques, such as molecular beam epitaxy [3], metalorganic chemical vapour deposition [4], chemical bath deposition [5], RF magnetron sputter [6] and pulsed laser deposition (PLD) [7], are used to grow the ZnO layer. Emission of light in the wavelength range of 390-415 nm has also been observed from these devices [5,[8][9][10].…”
Section: Introductionmentioning
confidence: 99%