2013
DOI: 10.1088/0957-4484/24/18/185401
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Thermal conductivity measurements of single-crystalline bismuth nanowires by the four-point-probe 3-ω technique at low temperatures

Abstract: We have successfully investigated the thermal conductivity (κ) of single-crystalline bismuth nanowires (BiNWs) with [110] growth direction, via a straightforward and powerful four-point-probe 3-ω technique in the temperature range 10-280 K. The BiNWs, which are well known as the most effective material for thermoelectric (TE) device applications, were synthesized by compressive thermal stress on a SiO2/Si substrate at 250-270 °C for 10 h. To understand the thermal transport mechanism of BiNWs, we present three… Show more

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Cited by 22 publications
(22 citation statements)
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References 22 publications
(57 reference statements)
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“…In the current study, we utilized a four-point probe 3- ω method based on the application of an alternating current (AC) with angular modulation frequency (1- ω ), which was first developed by Cahill in 1990 [20] to measure the temperature-dependent thermal conductivities of as-grown Fe 3 O 4 thin films. It has been proved the most promising technique to extract thermal conductivities of 1D nanostructures such as nanowires [21,22] and carbon nanotubes [23,24] and thin films [25-27]. We have also proved this technique to be one of the powerful methods to extract the thermal conductivity of most low-dimensional materials [21].…”
Section: Methodsmentioning
confidence: 99%
“…In the current study, we utilized a four-point probe 3- ω method based on the application of an alternating current (AC) with angular modulation frequency (1- ω ), which was first developed by Cahill in 1990 [20] to measure the temperature-dependent thermal conductivities of as-grown Fe 3 O 4 thin films. It has been proved the most promising technique to extract thermal conductivities of 1D nanostructures such as nanowires [21,22] and carbon nanotubes [23,24] and thin films [25-27]. We have also proved this technique to be one of the powerful methods to extract the thermal conductivity of most low-dimensional materials [21].…”
Section: Methodsmentioning
confidence: 99%
“…Thus, the lattice thermal conductivity is dominant thermal transport at low temperature, whereas the electronic thermal conductivity becomes progressively more important as temperature increase. Similarly, we observed that the thermal conductivity was almost constant up to 200 K and then slightly increased above 200 K in BiNW by enhanced boundary scattering via electrons [20]. As shown in Figure 4b, the length of the charge carrier MFP is longer than the neck size of the nanoporous Bi thin films with approximately 135- and approximately 200-nm pore diameters suggesting that the boundary scattering by charge carriers and bipolar diffusion at the pore surfaces, as the neck size decrease, could play a significant role in the suppression of the thermal conductivity of nanoporous Bi thin films at 300 K. Moreover, the nanoporous Bi thin film exhibits a lower thermal conductivity than 1D Bi NWs.…”
Section: Resultsmentioning
confidence: 82%
“…As shown in Figure 4b, the length of the charge carrier MFP is longer than the neck size of the nanoporous Bi thin films with approximately 135- and approximately 200-nm pore diameters suggesting that the boundary scattering by charge carriers and bipolar diffusion at the pore surfaces, as the neck size decrease, could play a significant role in the suppression of the thermal conductivity of nanoporous Bi thin films at 300 K. Moreover, the nanoporous Bi thin film exhibits a lower thermal conductivity than 1D Bi NWs. The thermal conductivity of a single-crystalline BiNW (approximately 120 nm in diameter) was measured to be approximately 2.9 W/m∙K at 280 K, confirming that nanoporous Bi thin films exhibit a lower thermal conductivity than 1D Bi NWs [20]. Consequently, the nanoporous architecture should provide promising scalable TE materials with low thermal conductivities, which have advantages over 1D nanostructure, such as nanowires and nanotubes.…”
Section: Resultsmentioning
confidence: 95%
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“…Cross-plane thermal conductivity measurements were conducted using four-point-probe 3- ω measurements in the 20 to 300 K temperature range in a vacuum of 5 × 10 −5  Torr, which has been proven to be a promising measurement technique for both 1D nanostructures [7,8,32] and 2D thin films [28]. Figure 3 shows the temperature oscillation of the in-phase component, Δ T s+f ( ω ), for the 400-nm-thick Sb 2 Te 3 thin films annealed at temperatures of 200°C to 350°C, with the Δ T s ( ω ) value of the substrates (SiO 2 /Si) also added as a reference.…”
Section: Resultsmentioning
confidence: 99%