By combining commonly available solar cell characterization methods with easy-to-prepare test structures and partially processed rear-passivated solar cells from the production line, we show that various cell loss mechanisms can be quantified in exquisite detail to generate process-related diagnostics. An example monocrystalline silicon localized back surface field solar cell type is examined using a systematic routine that breaks down the factors limiting open-circuit voltage, short-circuit current, and fill factor (FF) to identify the cell structure's headroom for improvement.
Index Terms-Characterization, metrology, Si PV modeling.c 22 nA/cm 2 Passivated emitter first diode J 0 e Kane-Swanson method 93 fA/cm 2 Bulk and rear passivation first diode J 0 1 , b a s e , p a s s J 0 1 , C − J 0 e 117 fA/cm 2 Rear contacts first diode J 0 1 , r e a r , m e t J 0 1 , D − J 0 1 , C 80 fA/cm 2 Rear contacts second diode J 0 2 , r e a r , m e t J 0 2 , D − J 0 2 , C 3 nA/cm 2 Cell base first diode J 0 1 , b a s e , c e ll J 0 1 , b a s e , p a s s + J 0 1 , r e a r , m e t 197 fA/cm 2 Junction second diode J 0 2 , ju n c t io n J 0 2 , C 14 nA/cm 2 First diode due to front metallization J 0 1 , f r o n t , m e t J 0 1 , E − J 0 1 , D 150 fA/cm 2 Second diode due to front metallization J 0 2 , f r o n t , m e t J 0 2 , E − J 0 2 , D 5 nA/cm 2