2016
DOI: 10.1039/c6ja90034h
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2016 Atomic Spectrometry Update – a review of advances in X-ray fluorescence spectrometry and its applications

Abstract: This review covers developments in and applications of XRF techniques such as EDXRF, WDXRF, TXRF, XRF microscopy using technologies such as synchrotron sources, X-ray optics, X-ray tubes and detectors in laboratory, mobile and hand-held systems.

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Cited by 46 publications
(17 citation statements)
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“…The use and applications for XRF have been reviewed in numerous books and journal papers, including the extensive annual reviews in the Journal of Analytical Atomic Spectrometry (West et al . , , ). A recent book (Croudace and Rothwell ) discussed the use of micro‐XRF for analysing sediment cores, covering the history, its applications and the technical issues related to its use.…”
Section: Developments In Instrumental Neutron Activation Analysis Andmentioning
confidence: 99%
“…The use and applications for XRF have been reviewed in numerous books and journal papers, including the extensive annual reviews in the Journal of Analytical Atomic Spectrometry (West et al . , , ). A recent book (Croudace and Rothwell ) discussed the use of micro‐XRF for analysing sediment cores, covering the history, its applications and the technical issues related to its use.…”
Section: Developments In Instrumental Neutron Activation Analysis Andmentioning
confidence: 99%
“…Various analytical methods have been developed by using X-rays that interact with substances such as transmission, scattering, reflection, and so on. For example, X-ray fluorescence (XRF) analysis of a nondestructive method enables the elemental analysis under atmospheric conditions [1,2]. One of the characteristics is that X-ray imaging analysis called an XRF imaging method can obtain a two-dimen-sional element distribution by using X-ray optics [3].…”
Section: Introductionmentioning
confidence: 99%
“…The latter technique provides detailed information on elemental chemistry such as oxidation state and molecular geometry [72,73]. Based on the energy region of interest, XAS can be further differentiated into X-ray absorption near-edge structure, extending from the pre-edge region to approximately 50 eV above the absorption edge and extended X-ray absorption fine structure (EXAFS), extending from about 50 to 1000 eV beyond the edge.…”
Section: Synchrotron Radiationmentioning
confidence: 99%
“…Another technique based on the absorption of X-rays in matter described above is XRF [72,73]. XRF permits quantitative elemental mapping.…”
Section: Synchrotron Radiationmentioning
confidence: 99%