“…To measure voltage guardbands, it is essential to craft worst-case voltage noise stress tests (also known as dI/dt viruses) that expose worst-case voltage droops [2,8,13]. Typically, these stress-tests are automatically generated using optimization approaches, such as Genetic Algorithms (GA), guided by direct voltage measurements [2,8]. Since X-Gene2 doesn't support fine-grained voltage measurements, to generate dI/dt viruses, we use an alternative methodology which is based on sensing high voltage noise through CPU electromagnetic emanations (EM) [14].…”